Ms. Xiaoyue Bian Profile

Xiaoyue Bian

at Suzhou H&L Instruments LLC

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 19 December 2022 Poster + Paper

Interferometric measurement of thickness variation of double-sided polished wafer

Xiaoyue Bian, Sen Han, Jun Cheng, Linghua Zhang, Quanzhao Wang, Xueyuan Li, Quanying Wu

Proceedings Volume 12319, 123191B (2022) https://doi.org/10.1117/12.2643049

KEYWORDS: Semiconducting wafers, Interferometers, Polishing, Phase interferometry, Photovoltaics, Surface finishing, Interferometry, Wafer bonding, Reliability, Phase shifts

Read Abstract +

Proceedings Article | 19 December 2022 Poster + Paper

Research on interferometric inspection of surface topography of ring elements

Jun Cheng, Sen Han, Xiaoyue Bian, Xianyu Wu, Xianhao Qi, Linghua Zhang, Qiang Cheng

Proceedings Volume 12319, 123191F (2022) https://doi.org/10.1117/12.2643403

KEYWORDS: Inspection, Interferometers, Interferometry, Technology, Spherical lenses, Design and modelling, Optical components, Equipment, Mirrors, Metals

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years