Dr. Sunil Bean
at Argonne National Lab
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 September 2019 Paper
Deming Shu, Vincent De Andrade, Jayson Anton, Steven Kearney, Kamel Fezzaa, Sunil Bean, Alex Deriy, Wenjun Liu, Jorg Maser, Barry Lai, Jonathan Tischler, Francesco De Carlo
Proceedings Volume 11112, 111120N (2019) https://doi.org/10.1117/12.2529384
KEYWORDS: Mechanical engineering, Hard x-rays, X-rays, Mirrors, Nanoprobes, Microscopes, Spatial resolution, X-ray microscopy, Microscopy, Finite element methods

Proceedings Article | 7 September 2017 Presentation + Paper
Janet Sheung, Jun Qian, Joseph Sullivan, Muriel Thomasset, Jonathan Manton, Sunil Bean, Peter Takacs, Joseph Dvorak, Lahsen Assoufid
Proceedings Volume 10385, 1038508 (2017) https://doi.org/10.1117/12.2279053

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