CONFERENCE PROCEEDINGS
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Jonathan Manton
at Inprentus Inc
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 13 March 2024 Presentation
Blazed gratings for AR made by contact-mode lithography
Peter Abbamonte, Jonathan Manton, Subhalakshmi Kumar, Samuel Gleason, Cody Jensen, Nick Toombs
Proceedings Volume PC12913, PC129130E (2024) https://doi.org/10.1117/12.3021557
Proceedings Article | 16 March 2023 Presentation
Mechanically ruled blazed gratings for AR waveguides (Conference Presentation)
Proceedings Volume 12449, 124490C (2023) https://doi.org/10.1117/12.2666778
KEYWORDS: Waveguides, Blazed gratings, Diffraction gratings, Wavefronts, Spectral response, Electron beam lithography, Diamond
Proceedings Article | 7 September 2017 Presentation + Paper
Metrology of variable-line-spacing x-ray gratings using the APS Long Trace Profiler
Janet Sheung, Jun Qian, Joseph Sullivan, Muriel Thomasset, Jonathan Manton, Sunil Bean, Peter Takacs, Joseph Dvorak, Lahsen Assoufid
Proceedings Volume 10385, 1038508 (2017) https://doi.org/10.1117/12.2279053
Proceedings Article | 7 September 2017 Paper
Intrinsic resolving power of XUV diffraction gratings measured with Fizeau interferometry
Samuel Gleason, Jonathan Manton, Janet Sheung, Taylor Byrum, Cody Jensen, Lingyun Jiang, Joseph Dvorak, Ignace Jarrige, Peter Abbamonte
Proceedings Volume 10385, 1038506 (2017) https://doi.org/10.1117/12.2272616
KEYWORDS: Diffraction gratings, Interferometry, Spectral resolution, Extreme ultraviolet, Metrology, Wavefront sensors, X-ray astronomy, Astronomical imaging, X-ray optics
Conference Committee Involvement (3)
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
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