Dr. Ramon Rodriguez-Vera Profile

Dr. Ramon Rodriguez-Vera

Research Director at Centro de Investigaciones en Óptica AC

SPIE Involvement:

Author

Publications (41)

Proceedings Article | 3 November 2011 Paper

Michelson microscope interference objective for micro-structure topography measuring

K. Hernández, R. Rodríguez-Vera, J. Rayas

Proceedings Volume 8011, 80117U (2011) https://doi.org/10.1117/12.903319

KEYWORDS: Microscopes, Integrated circuits, Charge-coupled devices, Interferometry, Beam splitters, Objectives, Error analysis, Manufacturing, Phase shifts, Thin films

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Proceedings Article | 3 November 2011 Paper

Geometrical properties of microstructures by Mirau interferometric objective microscope

M. Juárez, R. Rodríguez-Vera, J. Rayas

Proceedings Volume 8011, 80117N (2011) https://doi.org/10.1117/12.903255

KEYWORDS: Interferometry, Microscopes, Thin films, Interferometers, Atomic force microscopy, Integrated optics, Atomic force microscope, Light emitting diodes, Mach-Zehnder interferometers, CCD cameras

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Proceedings Article | 25 October 2011 Paper

High topographical accuracy by optical noise reduction in digital holographic microscopy

Miguel León-Rodríguez, Ramón Rodríguez-Vera, Juan Rayas, Sergio Calixto

Proceedings Volume 8011, 801116 (2011) https://doi.org/10.1117/12.902595

KEYWORDS: Digital holography, Holograms, Image processing, 3D image reconstruction, Denoising, Photons, Optical simulations, Light emitting diodes, Atomic force microscopy, Microscopy

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Proceedings Article | 26 July 2011 Paper

Different polynomial expressions for wavefront aberrations

Daniel Malacara-Hernández, Armando Gomez-Vieyra, Ramón Rodriguez-Vera, Eduardo Basurto-Uribe

Proceedings Volume 8001, 800108 (2011) https://doi.org/10.1117/12.892567

KEYWORDS: Wavefronts, Wavefront aberrations, Monochromatic aberrations, Optical spheres, Spherical lenses, Chromatic aberrations, Zernike polynomials, Geometrical optics, Distortion, Optics manufacturing

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Proceedings Article | 4 December 2009 Paper

Young's modulus determination of a circular plate by ESPI

Mariana Farías, Ramón Rodríguez-Vera, Juan Antonio Rayas

Proceedings Volume 7499, 749912 (2009) https://doi.org/10.1117/12.849076

KEYWORDS: Aluminum, Nondestructive evaluation, Interferometry, Microelectromechanical systems, Digital signal processing, Charge-coupled devices, MATLAB, Speckle pattern, Modulation, Collimation

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Proceedings Article | 3 October 2008 Paper

Static and dynamic 3D contouring by using structured light

R. Rodriguez-Vera, D. Vasquez, K. Genovese, J. A. Rayas, F. Mendoza-Santoyo

Proceedings Volume 7155, 71552A (2008) https://doi.org/10.1117/12.814584

KEYWORDS: Fringe analysis, CCD cameras, Clouds, Microscopes, Image processing, Fourier transforms, Ronchi rulings, Aluminum, Phase shift keying, Structured light

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Proceedings Article | 16 May 2007 Paper

Fourier transform method and temporal phase in order to measure frequency, amplitude, and surface profile of a low-frequency vibrating cantilever

Cruz Meneses-Fabian, Ramon Rodriguez-Vera, Juan Rayas, Fernando Mendoza-Santoyo, Gustavo Rodríguez-Zurita

Proceedings Volume 6422, 64221M (2007) https://doi.org/10.1117/12.742371

KEYWORDS: Fringe analysis, Ronchi rulings, Phase shifting, CCD cameras, Fourier transforms, Cameras, Projection systems, 3D acquisition, Digital imaging, High speed cameras

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Proceedings Article | 15 September 2006 Paper

Very high-speed digital holography

Carlos Pérez López, Fernando Mendoza Santoyo, Ramón Rodríguez Vera, David Moreno, Bernardino Barrientos

Proceedings Volume 6341, 63412Y (2006) https://doi.org/10.1117/12.695997

KEYWORDS: Digital holography, Holograms, Cameras, Continuous wave operation, Pulsed laser operation, Speckle, High speed cameras, Image resolution, CCD cameras, CMOS cameras

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Proceedings Article | 15 September 2006 Paper

Systematic error compensation in electronic speckle pattern shearing interferometry

R. Rodríguez-Vera, R. Cordero, F. Labbe, J. Rayas, Amalia Martínez, F. Mendoza-Santoyo

Proceedings Volume 6341, 63411J (2006) https://doi.org/10.1117/12.695375

KEYWORDS: Speckle pattern, Interferometers, Interferometry, Fringe analysis, Shearography, Mirrors, Gold, Nondestructive evaluation, Error analysis, Distance measurement

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Proceedings Article | 21 June 2006 Paper

Depth quantificaton for inhomogeneities within semisolid materials using 3D pulsed digital holography

Maria del Socorro Hernández-Montes, Fernando Mendoza Santoyo, Carlos Pérez-López, Ramón Rodríguez Vera

Proceedings Volume 6345, 63450F (2006) https://doi.org/10.1117/12.693154

KEYWORDS: Digital holography, Tumors, Holograms, Glasses, Pulsed laser operation, 3D modeling, Tissues, Calibration, Solids, Optical spheres

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Proceedings Article | 10 February 2006 Paper

Young's modulus determination of new polymeric materials using optical techniques

R. Rodriguez-Vera, J. Rayas, Amalia Martinez, O. Rodriguez, I. Yañez

Proceedings Volume 6046, 604610 (2006) https://doi.org/10.1117/12.674476

KEYWORDS: Polymers, Speckle pattern, Fringe analysis, Interferometers, Interferometry, Wavefronts, Charge-coupled devices, Speckle, Mechanics, Solids

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Proceedings Article | 10 February 2006 Paper

Three-dimensional micro-topography by Talbot-projected fringes

J. Rayas, R. Rodriguez-Vera, Amalia Martinez

Proceedings Volume 6046, 60461Y (2006) https://doi.org/10.1117/12.674609

KEYWORDS: Fringe analysis, Microscopes, Modulation, Ronchi rulings, Surface finishing, Diffraction gratings, CCD cameras, Speckle, Phase shifts, Structured light

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Proceedings Article | 14 February 2005 Paper

3D shape detection based on a Bezier neural network of a light line

J. Munoz Rodriguez, Miguel Rosales Cisena, Ramon Rodriguez-Vera

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611840

KEYWORDS: Neurons, Neural networks, Image processing, Cameras, Semiconductor lasers, Optical testing, Glasses, CCD cameras, Projection systems, Nickel

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Proceedings Article | 14 February 2005 Paper

Aeolic vibration of aerial electricity transmission cables

A. Avila, Ramon Rodriguez-Vera, Juan Rayas, Bernardino Barrientos

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611904

KEYWORDS: Fringe analysis, Distance measurement, Lanthanum, Bridges, Computing systems, Spherical lenses, Temperature metrology, Geometrical optics, Optical metrology, Vibrometry

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Proceedings Article | 14 February 2005 Paper

Uncertainty evaluation of displacements measured by ESPI with divergent wavefronts

Amalia Martinez, Raul Cordero, Juan Rayas, Hugo Puga, Ramon Rodriguez-Vera

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611903

KEYWORDS: Interferometers, Wavefronts, Uncertainty analysis, Statistical analysis, Error analysis, Phase interferometry, Spherical lenses, Optical testing, Optical interferometry, Phase shifting

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Proceedings Article | 14 February 2005 Paper

Data amalgamation in the digitalization of 3D objects all over its 360 degrees

Juan Rayas, Ramon Rodriguez-Vera, Amalia Martinez

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611861

KEYWORDS: Clouds, Fringe analysis, 3D acquisition, Image processing, CCD cameras, Solids, Modulation, 3D modeling, Cameras, Digital imaging

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Proceedings Article | 21 October 2004 Paper

Three-illumination-source position optimization for interferometry

Amalia Martinez, J. Rayas, Ramon Rodriguez-Vera, Hugo Puga

Proceedings Volume 5622, (2004) https://doi.org/10.1117/12.591955

KEYWORDS: Interferometry, 3D metrology, Sensors, Digital holography, Shearography, Nondestructive evaluation, Laser optics, CCD cameras, Geometrical optics, Optical metrology

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Proceedings Article | 19 November 2003 Paper

Sensitivity study in moiré interferometry under spherical illumination

Ramon Rodriguez-Vera, J. Rayas, Alejandrina Martinez

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.524845

KEYWORDS: Moire patterns, Spherical lenses, Interferometry, Deflectometry, Phase measurement, Interferometers, Wavefronts, Collimation, Diffraction gratings, Geometrical optics

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Proceedings Article | 10 November 2003 Paper

Scattered data beam analyzer

Javier Sanchez-Mondragon, Jesus Escobedo-Alatorre, Ramon Rodriguez-Vera, Roberto Rojas-Laguna, Romeo Selvas-Aguilar, Miguel Basurto-Pensado

Proceedings Volume 5181, (2003) https://doi.org/10.1117/12.507399

KEYWORDS: Zernike polynomials, Beam analyzers, Bessel beams, Bessel functions, Radon, Wavefronts, Interferometry, Sensors, Astrophysics, Electronics

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Proceedings Article | 6 October 2003 Open Access

An Associated Degree in Electronic Engineering with specialization in optics

J. Sánchez-Mondragón, J. Escobedo-Alatorre, M. Tecpoyotl-Torres, M. Basurto-Pensado, R. Rodriguez-Vera, R. Selvas

Proceedings Volume 9663, 96632T (2003) https://doi.org/10.1117/12.2208445

KEYWORDS: Electronics engineering, Physics, Quantum optics, Photonics, Quantum mechanics, Electrical engineering, Optical engineering, Quantum electronics, Software, Education and training

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Proceedings Article | 29 July 2002 Paper

Evaluation of object's roughness and spherical illumination in grating moire and speckle interferometry

Ramon Rodriguez-Vera, Alejandrina Martinez, Hugo Puga, J. Rayas

Proceedings Volume 4900, (2002) https://doi.org/10.1117/12.484456

KEYWORDS: Diffraction gratings, Spherical lenses, Moire patterns, Interferometry, Interferometers, Deflectometry, Speckle interferometry, Fringe analysis, Visualization, Visibility

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Optical non-destructive testing have been broadly used for flaw analysis in engineering structures. The valuable of these techniques has been their easiness to obtain full field information. Likewise, with them one can determine with high precision micro—displacements due to different types of loads. Holographic, moire, and speckle interferometry are the most common optical non-destructive techniques. Particular experimental arrangements can be built to measure in- and out-of-plane displacements. Commonly, in-plane speckle and moire grating techniques use collimated symmetrical beams for target illuminating. However, when the target illumination beams are spherical, a series of errors in the interpretation of the interference fringes appears. Among these errors, under this kind of illumination, are those due to light arising out-of-plane displacement components. These components are of supreme importance when the objects to be analyzed are of considerable size. In this paper, the importance of shape and out-of-plane displacements as factors that introduce error in the interpretation of a phase map obtained from a grating moire and in-plane ESPI interferometers, are evaluated. The analysis is done utilizing the uncertainty of the sensitivity vector varying as a position function on the surface under study. The effect of a slight out-ofplane displacements and surface shape upon the change of the sensitivity vector are numerically analyzed. This numerical analysis shows that serious measurement error can be obtained when these factors are neglected. It shows that the possible errors in the measurement from the ESPI and grating moire interferometers using non-collimated object illumination can be estimate before doing the measurement. A general function of correction in phase map interpretation for any in-plane sensitive interferometric scheme, in spherical illumination, is proposed. Since moire interferometry uses a grating specimen recorded on a mirror-like and prepared with a fine diffraction grating (typically ~12OO lines per millimeter). Gratings are commonly made of photoresist. However, if we want to analyze engineering structures in spherical illumination, in order to have a surface without pre-prepared under polishing, the surface roughness is an important parameter to be characterized. Then, additionally in this work first we analyze the fringe visibility of moire during the fabrication of specimen gratings as a function ofthe surface object roughness.

Proceedings Article | 29 May 2002 Paper

Real discontinuity preservation algorithm for ESPI fracture measuring

Ramon Rodriguez-Vera, J. Rayas, Jose Marroquin Zaleta, Mariano Rivera, J. Quiroga

Proceedings Volume 4537, (2002) https://doi.org/10.1117/12.468840

KEYWORDS: Speckle interferometry, Phase shift keying, Image processing, Fringe analysis, Speckle, Modulation, Phase measurement, Optical filters, Optical metrology, Structural engineering

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Proceedings Article | 11 September 2001 Paper

Spatial phase-stepping using a computer-generated diffractive optical element

Ramon Rodriguez-Vera, Bernardino Barrientos, Andrew Moore

Proceedings Volume 4420, (2001) https://doi.org/10.1117/12.439207

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SPIE Journal Paper | 1 September 2001

Influence of object roughness on specimen gratings for moire interferometry

Amalia Martinez, Ramon Rodriguez-Vera, J. Rayas, Jose Vazquez-Luna

OE, Vol. 40, Issue 09, (September 2001) https://doi.org/10.1117/12.10.1117/1.1394738

KEYWORDS: Surface finishing, Diffraction gratings, Photoresist materials, Deflectometry, Visibility, Diffraction, Polishing, Surface roughness, Fringe analysis, Interferometry

Proceedings Article | 14 August 2001 Paper

Evaluation of error introduced by in-plane system using spherical wavefronts

Amalia Martinez, Ramon Rodriguez-Vera, J. Rayas, J. Puga

Proceedings Volume 4419, (2001) https://doi.org/10.1117/12.437100

KEYWORDS: Spherical lenses, Moire patterns, Wavefronts, Speckle, Interferometry, Collimation, Mirrors, Fringe analysis, Interferometers, Visualization

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SPIE Journal Paper | 1 August 2001

Mapping correlation algorithm as interface between experimental optical technique and computer modeling for the study of mechanical structures

Hugo Puga, Ramon Rodriguez-Vera, Salvador Botello

OE, Vol. 40, Issue 08, (August 2001) https://doi.org/10.1117/12.10.1117/1.1387993

KEYWORDS: Finite element methods, 3D modeling, Curium, CCD cameras, Optical engineering, Human-machine interfaces, Associative arrays, Computer simulations, Speckle, 3D metrology

SPIE Journal Paper | 1 September 2000

Direct object shape detection based on skeleton extraction of a light line

J. Munoz-Rodriguez, Ramon Rodriguez-Vera, Manuel Servin Guirado

OE, Vol. 39, Issue 09, (September 2000) https://doi.org/10.1117/12.10.1117/1.1287931

KEYWORDS: Fringe analysis, Optical engineering, Optical testing, Semiconductor lasers, CCD cameras, Computer simulations, Spherical lenses, Image resolution, Cameras, Optical metrology

Proceedings Article | 22 May 2000 Paper

Separation of vibration fringe data from rotating object fringes in pulsed ESPI

Carlos Perez-Lopez, Fernando Mendoza Santoyo, Ramon Rodriguez-Vera

Proceedings Volume 4072, (2000) https://doi.org/10.1117/12.386755

KEYWORDS: Speckle pattern, Interferometry, Fringe analysis, Pulsed laser operation, Speckle, Electro optics, Quantitative analysis, CCD cameras, Charge-coupled devices, Imaging systems

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Proceedings Article | 29 December 1998 Paper

Contrast enhancement of ESPI addition fringes using real-time electronic filtering

Ramon Rodriguez-Vera, Carlos Perez-Lopez, Fernando Mendoza Santoyo, Bernardino Barrientos

Proceedings Volume 3682, (1998) https://doi.org/10.1117/12.334781

KEYWORDS: Fringe analysis, Fluctuations and noise, Electronic filtering, Speckle pattern, Pulsed laser operation, Nd:YAG lasers, Diodes, Interferometers, Charge-coupled devices, Pulse generators

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Proceedings Article | 30 June 1998 Paper

Regularization methods for processing fringe pattern images

Jose Marroquin Zaleta, Mariano Rivera, Salvador Botello, Ramon Rodriguez-Vera, Manuel Servin Guirado

Proceedings Volume 3478, (1998) https://doi.org/10.1117/12.312949

KEYWORDS: Fringe analysis, Image filtering, Image processing, Demodulation, Digital filtering, Electroluminescence, Modulation, Phase shifts, Data modeling, Image segmentation

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Proceedings Article | 1 September 1996 Paper

Correlation requirements for displacement analysis by ESPI experimental and FEM analytical methods

R. Rodríguez-Vera

Proceedings Volume 2778, 27784D (1996) https://doi.org/10.1117/12.2299039

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Proceedings Article | 17 July 1996 Paper

Unwrapping of noisy phase maps: a comparison of two methods

Ramon Rodriguez-Vera, Guillermo Kaufmann, Manuel Servin Guirado, Andrew Moore

Proceedings Volume 2860, (1996) https://doi.org/10.1117/12.276337

KEYWORDS: Image processing, Fringe analysis, Algorithm development, Demodulation, Computer simulations, Optical metrology, Differential equations, Control systems, Denoising, Metrology

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