Ms. Hyobe Jung Profile

Hyobe Jung

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Publications (1)

Proceedings Article | 27 April 2023 Paper

AI-guided reliability diagnosis for 5,7nm automotive process

Dongin Kim, Hyung Joo Lee, Sanghyun Choi, Seungpyo Hong, Seungjae Lee, Doohwan Kwak, Srividya Jayaram, Seungwon Paek, Minho Kwon, Yeongdo Kim, Hyobe Jung, Ivan Kissiov, Melody Tao, Andres Torres, Nathan Greeneltch, Ho Lee

Proceedings Volume 12496, 124963J (2023) https://doi.org/10.1117/12.2662880

KEYWORDS: Reliability, Semiconducting wafers, Data modeling, Manufacturing, Fabrication, Semiconductors, Industry, High volume manufacturing, Model-based design, Metrology

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