Dr. Christian Morawe Profile

Dr. Christian Morawe

at ESRF - The European Synchrotron

SPIE Involvement:

Conference Chair | Editor | Author

Publications (41)

Proceedings Article | 8 October 2024 Presentation + Paper

X-ray mirror figure correction using differential deposition

Ch. Morawe, S. Labouré, F. Perrin, A. Vivo, R. Barrett

Proceedings Volume 13150, 1315003 (2024) https://doi.org/10.1117/12.3027938

KEYWORDS: X-ray optics, Thin films, Multilayers, Mirrors, Mirror surfaces, Coating, Silicon, Metrology, X-rays, Fizeau interferometers

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Proceedings Article | 3 October 2023 Presentation + Paper

Surface figure correction using differential deposition of WSi2

Ch. Morawe, P. Bras, S. Labouré, F. Perrin, A. Vivo

Proceedings Volume 12694, 1269405 (2023) https://doi.org/10.1117/12.2676633

KEYWORDS: Film thickness, Mirrors, Mirror surfaces, Coating stress, Silicon, Metrology, X-rays, Sputter deposition, X-ray optics, Thin film deposition

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Proceedings Article | 7 June 2023 Presentation + Paper

Differential deposition applied to x-ray mirror substrates

Patrice Bras, Sylvain Labouré, Amparo Vivo, François Perrin, Christian Morawe

Proceedings Volume 12576, 1257607 (2023) https://doi.org/10.1117/12.2665823

KEYWORDS: Reflection, X-rays, Mirrors, Mirror surfaces, X-ray optics, Particles, Optical surfaces, Metrology, X-ray characterization

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Proceedings Article | 4 October 2022 Paper

The new ESRF compact multilayer coating system

Ch. Morawe, P. Bras, C. Guilloud, S. Labouré, J-Ch. Peffen

Proceedings Volume 12240, 1224002 (2022) https://doi.org/10.1117/12.2632702

KEYWORDS: Coating, Multilayers, Thin films, X-ray optics, Particles, X-rays, Optical components, Sputter deposition

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Proceedings Article | 21 September 2021 Presentation + Paper

Mirror figure correction on variable length scales

Ch. Morawe, P. Bras, S. Labouré, F. Perrin, A. Vivo

Proceedings Volume 11837, 118370C (2021) https://doi.org/10.1117/12.2595034

KEYWORDS: Platinum, Mirrors, X-rays, X-ray optics, Chromium, Metrology, Thin film coatings, Surface roughness, Silicon, Reflectivity

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Proceedings Article | 9 September 2019 Presentation + Paper

Differential deposition for figure correction of x-ray mirrors

Ch. Morawe, S. Labouré, J-Ch. Peffen, F. Perrin, A. Vivo, R. Barrett

Proceedings Volume 11108, 1110807 (2019) https://doi.org/10.1117/12.2528750

KEYWORDS: Chromium, Mirrors, X-rays, Surface roughness, Reflectivity, X-ray optics, Metrology, Thin film coatings, Interferometers, Scanning electron microscopy

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Proceedings Article | 17 September 2018 Presentation + Paper

The new ESRF thin-film x-ray reflectometer

Ch. Morawe, J.-Ch. Peffen, P. Pakawanit

Proceedings Volume 10760, 1076005 (2018) https://doi.org/10.1117/12.2319833

KEYWORDS: X-rays, Reflectometry, Thin films, Reflectivity, Calibration, Monochromators, Multilayers, Collimators, Crystals

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Proceedings Article | 10 July 2018 Presentation + Paper

Topological design of lightweight additively manufactured mirrors for space

Carolyn Atkins, Charlotte Feldman, David Brooks, Stephen Watson, William Cochrane, Melanie Roulet, Emmanuel Hugot, Mat Beardsley, Michael Harris, Christopher Spindloe, Simon Alcock, Ioana-Theodora Nistea, Christian Morawe, François Perrin

Proceedings Volume 10706, 107060I (2018) https://doi.org/10.1117/12.2313353

KEYWORDS: Mirrors, Polishing, Surface roughness, Additive manufacturing, Finite element methods, Space mirrors, Aluminum, Single point diamond turning, Lightweight mirrors, Error analysis, 3D printing

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Additive manufacturing (AM), more commonly known as 3D printing, is a commercially established technology for rapid prototyping and fabrication of bespoke intricate parts. To date, research quality mirror prototypes are being trialled using additive manufacturing, where a high quality reflective surface is created in a post-processing step. One advantage of additive manufacturing for mirror fabrication is the ease to lightweight the structure: the design is no longer confined by traditional machining (mill, drill and lathe) and optimised/innovative structures can be used. The end applications of lightweight AM mirrors are broad; the motivation behind this research is low mass mirrors for space-based astronomical or Earth Observation imaging. An example of a potential application could be within nano-satellites, where volume and mass limits are critical. The research presented in this paper highlights the early stage experimental development in AM mirrors and the future innovative designs which could be applied using AM.

The surface roughness on a diamond-turned AM aluminium (AlSi₁₀Mg) mirror is presented which demonstrates the ability to achieve an average roughness of ~3.6nm root mean square (RMS) measured over a 3 x 3 grid. A Fourier transform of the roughness data is shown which deconvolves the roughness into contributions from the diamond-turning tooling and the AM build layers. In addition, two nickel phosphorus (NiP) coated AlSi₁₀Mg AM mirrors are compared in terms of surface form error; one mirror has a generic sandwich lightweight design at 44% the mass of a solid equivalent, prior to coating and the second mirror was lightweighted further using the finite element analysis tool topology optimisation. The surface form error indicates an improvement in peak-to-valley (PV) from 323nm to 204nm and in RMS from 83nm to 31nm for the generic and optimised lightweighting respectively while demonstrating a weight reduction between the samples of 18%. The paper concludes with a discussion of the breadth of AM design that could be applied to mirror lightweighting in the future, in particular, topology optimisation, tessellating polyhedrons and Voronoi cells are presented.

Proceedings Article | 23 August 2017 Paper

Thickness uniformity study on the ESRF multilayer deposition system

Damien Carau, Jean-Christophe Peffen, Christian Morawe

Proceedings Volume 10386, 103860V (2017) https://doi.org/10.1117/12.2273273

KEYWORDS: Multilayers, X-ray optics, X-rays, Reflectivity, Optical coatings, Reflectometry, Optimization (mathematics), Optical metrology, Optical simulations, Synchrotron radiation

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Proceedings Article | 23 August 2017 Presentation + Paper

Double multilayer monochromators for upgraded ESRF beamlines

Ch. Morawe, D. Carau, J.-Ch. Peffen

Proceedings Volume 10386, 1038603 (2017) https://doi.org/10.1117/12.2273609

KEYWORDS: Multilayers, Monochromators, Reflectivity, X-ray optics, Sputter deposition, Light sources, Crystals, Coating, X-rays

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Proceedings Article | 26 August 2015 Paper

Graded multilayers for figured Kirkpatrick-Baez mirrors on the new ESRF end station ID16A

Ch. Morawe, R. Barrett, P. Cloetens, B. Lantelme, J.-Ch. Peffen, A. Vivo

Proceedings Volume 9588, 958803 (2015) https://doi.org/10.1117/12.2189279

KEYWORDS: Mirrors, Multilayers, X-rays, Reflectivity, Diffraction, Sputter deposition, Optical coatings, X-ray optics, Nanoimaging, Optical simulations

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Proceedings Article | 17 September 2014 Paper

Reflection on multilayer mirrors: beam profile and coherence properties

A. Rack, C. Morawe, L. Mancini, D. Dreossi, D. Parkinson, A. MacDowell, F. Siewert, T. Rack, T. Holz, M. Krämer, R. Dietsch

Proceedings Volume 9207, 92070V (2014) https://doi.org/10.1117/12.2060801

KEYWORDS: Multilayers, Mirrors, Wavefronts, Reflection, X-rays, Light sources, Monochromators, Silicon, Reflectivity, Crystals

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Proceedings Article | 5 September 2014 Paper

Thermal expansion properties of thin multilayer films

Xianchao Cheng, Christian Morawe, Jean-Christophe Peffen, Lin Zhang

Proceedings Volume 9207, 920709 (2014) https://doi.org/10.1117/12.2059583

KEYWORDS: Palladium, Multilayers, Thin films, Temperature metrology, Silicon, Chromium, Semiconducting wafers, Coating, Wavefront sensors, Thin film coatings

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Proceedings Article | 5 September 2014 Paper

Graded multilayers for fully polarization resolved resonant inelastic x-ray scattering in the soft x-ray range

C. Morawe, J.-C. Peffen, R. Supruangnet, L. Braicovich, N. Brookes, G. Ghiringhelli, F. Yakhou-Harris

Proceedings Volume 9207, 92070J (2014) https://doi.org/10.1117/12.2061827

KEYWORDS: X-rays, Reflectivity, Polarization, Solids, Spectroscopy, Photons, Coating, Scattering, Laser scattering, Remote sensing

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Proceedings Article | 15 October 2012 Paper

Application of wave optical simulations to focusing x-ray multilayers

M. Osterhoff, Ch. Morawe

Proceedings Volume 8502, 850208 (2012) https://doi.org/10.1117/12.928938

KEYWORDS: Mirrors, Solids, Diffraction, Reflectivity, X-rays, Optical simulations, Computer simulations, X-ray optics, Software development, Optical components

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Proceedings Article | 28 September 2011 Paper

Dynamically-figured mirror system for high-energy nanofocusing at the ESRF

R. Barrett, R. Baker, P. Cloetens, Y. Dabin, C. Morawe, H. Suhonen, R. Tucoulou, A. Vivo, L. Zhang

Proceedings Volume 8139, 813904 (2011) https://doi.org/10.1117/12.894735

KEYWORDS: Mirrors, Finite element methods, X-rays, Polishing, Optics manufacturing, X-ray optics, Manufacturing, Multilayers, Silicon, Gold

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Proceedings Article | 28 September 2011 Paper

Spatial coherence studies on x-ray multilayers

Ch. Morawe, R. Barrett, K. Friedrich, R. Klünder, A. Vivo

Proceedings Volume 8139, 813909 (2011) https://doi.org/10.1117/12.894617

KEYWORDS: Silicon, Reflection, X-rays, Multilayers, Visibility, Surface roughness, Interfaces, Spatial coherence, Coherence (optics), Reflectivity

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Proceedings Article | 19 May 2011 Paper

Multilayer white beam study

K. Friedrich, Ch. Morawe, J.-Ch. Peffen, M. Osterhoff

Proceedings Volume 8077, 80770M (2011) https://doi.org/10.1117/12.887000

KEYWORDS: Reflectivity, Multilayers, X-rays, Monochromators, Zirconium, Synchrotrons, Transmission electron microscopy, Sensors, Radiation effects, Silicon

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Proceedings Article | 27 August 2010 Paper

In-situ stress measurements of sputtered multilayers

Ch. Morawe, J.-Ch. Peffen, K. Friedrich

Proceedings Volume 7802, 78020B (2010) https://doi.org/10.1117/12.860354

KEYWORDS: Ruthenium, Argon, Thin films, Coating, Interfaces, Multilayers, X-rays, X-ray optics, Solids, Reflectivity

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Proceedings Article | 27 August 2010 Paper

Micro-imaging performance of multilayers used as monochromators for coherent hard x-ray synchrotron radiation

A. Rack, T. Weitkamp, M. Riotte, T. Rack, R. Dietsch, T. Holz, M. Krämer, F. Siewert, M. Meduna, Ch. Morawe, P. Cloetens, E. Ziegler

Proceedings Volume 7802, 78020M (2010) https://doi.org/10.1117/12.858355

KEYWORDS: Monochromators, Multilayers, Light sources, Hard x-rays, Photons, Mirrors, X-ray imaging, Synchrotron radiation, Crystals, Coating

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Proceedings Article | 9 September 2009 Paper

Thickness control of large area x-ray multilayers

Ch. Morawe, J.-Ch. Peffen

Proceedings Volume 7448, 74480H (2009) https://doi.org/10.1117/12.826121

KEYWORDS: Coating, Mirrors, X-rays, Particles, Synchrotrons, Reflectivity, Glasses, Solids, Thin film coatings, X-ray optics

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Proceedings Article | 3 September 2008 Paper

Aberrations in curved x-ray multilayers

Ch. Morawe, J.-P. Guigay, V. Mocella, C. Ferrero, H. Mimura, S. Handa, K. Yamauchi

Proceedings Volume 7077, 70770T (2008) https://doi.org/10.1117/12.794534

KEYWORDS: Mirrors, Optical components, Interfaces, X-rays, X-ray optics, Diffraction, Monochromators, Ray tracing, Reflection, Refraction

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Proceedings Article | 27 September 2007 Paper

Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors

A. Rommeveaux, L. Assoufid, H. Ohashi, H. Mimura, K. Yamauchi, J. Qian, T. Ishikawa, C. Morawe, A. Macrander, A. Khounsary, S. Goto

Proceedings Volume 6704, 67040B (2007) https://doi.org/10.1117/12.736171

KEYWORDS: Mirrors, Spherical lenses, Metrology, X-rays, Error analysis, Silicon, Silicon carbide, Interferometry, Optical components, Sensors

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Proceedings Article | 20 September 2007 Paper

Multilayer growth in the APS rotary deposition system

Ray Conley, Chian Liu, Cameron Kewish, Albert Macrander, Christian Morawe

Proceedings Volume 6705, 670505 (2007) https://doi.org/10.1117/12.736024

KEYWORDS: Reflectivity, Sputter deposition, Multilayers, Silicon, X-rays, X-ray optics, Aluminum, Reflection, Process control, Thin films

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Proceedings Article | 20 September 2007 Paper

The new ESRF multilayer deposition facility

Ch. Morawe, Ch. Borel, J.-Ch. Peffen

Proceedings Volume 6705, 670504 (2007) https://doi.org/10.1117/12.734107

KEYWORDS: Multilayers, Argon, Reflectivity, Ions, Solids, Aluminum, Sputter deposition, Data modeling, Deposition processes, X-rays

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Proceedings Article | 11 September 2006 Paper

Reflectivity and stress responses of multilayers upon isothermal treatment

C. Borel, C. Morawe, A. Rommeveaux, C. Huguenot, J.-C. Peffen

Proceedings Volume 6317, 63170I (2006) https://doi.org/10.1117/12.678472

KEYWORDS: Multilayers, Annealing, Ruthenium, Reflectivity, Interfaces, Coating, Solids, Data modeling, X-rays, Metals

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Proceedings Article | 29 August 2006 Paper

Graded multilayers for focusing hard x-rays below 50 nm

Ch. Morawe, O. Hignette, P. Cloetens, W. Ludwig, Ch. Borel, P. Bernard, A. Rommeveaux

Proceedings Volume 6317, 63170F (2006) https://doi.org/10.1117/12.679039

KEYWORDS: Mirrors, Diffraction, Multilayers, Reflection, Reflectivity, X-rays, Refraction, Coating, Synchrotrons, X-ray optics

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Proceedings Article | 17 September 2005 Paper

Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories

Lahsen Assoufid, Amparo Rommeveaux, Haruhiko Ohashi, Kazuto Yamauchi, Hidekazu Mimura, Jun Qian, Olivier Hignette, Tetsuya Ishikawa, Christian Morawe, Albert Macrander, Ali Khounsary, Shunji Goto

Proceedings Volume 5921, 59210J (2005) https://doi.org/10.1117/12.623209

KEYWORDS: Mirrors, Silicon, Metrology, Data conversion, Error analysis, Sensors, X-rays, Fourier transforms, Optical metrology, Synchrotron radiation

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Proceedings Article | 17 September 2005 Paper

Mirror metrology and bender characterization at ESRF

Amparo Rommeveaux, Olivier Hignette, Christian Morawe

Proceedings Volume 5921, 59210N (2005) https://doi.org/10.1117/12.621379

KEYWORDS: Mirrors, Metrology, Head, Interferometers, Platinum, X-rays, Calibration, Interferometry, Optical components, Optical testing

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Proceedings Article | 31 August 2005 Paper

In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation

Christine Borel, Christian Morawe, Eric Ziegler, Thierry Bigault, Jean-Yves Massonnat, Jean-Christophe Peffen, Emilie Debourg

Proceedings Volume 5918, 591801 (2005) https://doi.org/10.1117/12.613873

KEYWORDS: Reflectivity, Annealing, Multilayers, Heat treatments, Data modeling, Synchrotron radiation, Ruthenium, X-rays, Synchrotrons, Interfaces

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Proceedings Article | 3 November 2004 Paper

Small-d-spacing WSi2/Si narrow bandpass multilayers

Chian Liu, Ray Conley, Albert Macrander, Timothy Graber, Christian Morawe, Christine Borel, Eric Dufresne

Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.561399

KEYWORDS: Silicon, X-rays, Reflectivity, Multilayers, Monochromators, Absorption, Interfaces, X-ray diffraction, Sputter deposition, Synchrotron radiation

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Proceedings Article | 3 November 2004 Paper

Layer intermixing in design and fabrication of double-gradient multilayers

Christine Borel, Christian Morawe, Jean-Christophe Peffen

Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.556773

KEYWORDS: Reflectivity, Multilayers, Mirrors, Ruthenium, Sputter deposition, Solids, Data centers, Calibration, Silicon, Control systems

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Proceedings Article | 3 November 2004 Paper

Application of double-gradient multilayers for focusing

Christian Morawe, Christine Borel, Eric Ziegler, Jean-Christophe Peffen

Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.555912

KEYWORDS: Mirrors, Multilayers, Reflectivity, Solids, X-rays, Synchrotrons, Reflection, Data centers, Ruthenium, X-ray optics

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Proceedings Article | 23 December 2003 Paper

Double multilayer monochromator to tailor bending magnet radiation spectrum

Thierry Bigault, Eric Ziegler, Christian Morawe, Robert Hustache, Jean-Yves Massonnat, Gerard Rostaing

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.515980

KEYWORDS: Monochromators, Crystals, Laser crystals, Reflectivity, Silicon, Absorption, Sensors, Ruthenium, Synchrotron radiation, Photonic crystals

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Proceedings Article | 23 December 2003 Paper

Double gradient multilayers for broadband focusing

Christian Morawe, Jean-Christophe Peffen, Eric Dufresne, Yong Chu, Albert Macrander

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.502658

KEYWORDS: Mirrors, Multilayers, Reflectivity, Solids, Silicon, Crystals, Charge-coupled devices, Coating, X-rays, Glasses

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Proceedings Article | 24 December 2002 Paper

Wideband multilayer mirrors for medium to hard x-ray applications

Eric Ziegler, Christian Morawe, Igor Kozhevnikov, T. Bigault, Claudio Ferrero, A. Tallandier

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455690

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Synchrotrons, Hard x-rays, X-ray optics, Astrophysics, Crystals, Optics manufacturing

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Proceedings Article | 10 December 2001 Paper

X-ray study of surfaces and interfaces

Victor Asadchikov, Inna Bukreeva, Angela Duparre, Igor Kozhevnikov, Yury Krivonosov, Christian Morawe, Mikhail Pyatakhin, Joerg Steinert, Alexander Vinogradov, Eric Ziegler

Proceedings Volume 4449, (2001) https://doi.org/10.1117/12.450102

KEYWORDS: Reflectivity, X-rays, Scattering, Multilayers, Inverse problems, Interfaces, Spatial frequencies, Atomic force microscopy, Silicon, Mirrors

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Proceedings Article | 14 November 2001 Paper

High-resolution Al203/B4C multilayers

Christian Morawe, Jean-Christophe Peffen, Eric Ziegler, Andreas Freund

Proceedings Volume 4501, (2001) https://doi.org/10.1117/12.448485

KEYWORDS: Silicon, Crystals, Multilayers, Aluminum, Reflectivity, X-rays, Scattering, Spectral resolution, X-ray optics, Laser crystals

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Proceedings Article | 5 January 2001 Paper

High-resolution multilayer x-ray optics

Christian Morawe, Jean-Christophe Peffen, Eric Ziegler, Andreas Freund

Proceedings Volume 4145, (2001) https://doi.org/10.1117/12.411658

KEYWORDS: Multilayers, Reflectivity, Spectral resolution, X-ray optics, X-rays, Coating, Interfaces, Information operations, Monochromators, Deposition processes

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Proceedings Article | 2 November 2000 Paper

X-ray study of the roughness of surfaces and interfaces

Igor Kozhevnikov, Victor Asadchikov, Inna Bukreeva, Angela Duparre, Yury Krivonosov, Christian Morawe, Vladimir Ostashev, Mikhail Pyatakhin, Eric Ziegler

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405809

KEYWORDS: Scattering, X-rays, Interfaces, Laser scattering, Polishing, Atomic force microscopy, Multilayers, Spatial frequencies, Mirrors, Surface roughness

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Proceedings Article | 16 November 1999 Paper

Design and performance of graded multilayers

Christian Morawe, Jean-Christophe Peffen, Olivier Hignette, Eric Ziegler

Proceedings Volume 3773, (1999) https://doi.org/10.1117/12.370083

KEYWORDS: Mirrors, Multilayers, Reflectivity, X-rays, Crystals, Monochromators, Solids, Sputter deposition, Silicon, Ions

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Showing 5 of 41 publications

Proceedings Volume Editor (20)

SPIE Conference Volume | 22 October 2024

Advances in X-Ray/EUV Optics and Components XIX

SPIE Conference Volume | 24 October 2023

Advances in X-Ray/EUV Optics and Components XVIII

SPIE Conference Volume | 13 October 2022

Advances in X-Ray/EUV Optics and Components XVII

SPIE Conference Volume | 8 October 2021

Advances in X-Ray/EUV Optics and Components XVI

SPIE Conference Volume | 23 September 2020

Advances in X-Ray/EUV Optics and Components XV

Showing 5 of 20 publications

Conference Committee Involvement (21)

Advances in X-Ray/EUV Sources, Optics, and Components XX

3 August 2025 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XIX

19 August 2024 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XVIII

22 August 2023 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XVII

22 August 2022 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XVI

2 August 2021 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XV

26 August 2020 | Online Only, California, United States

Advances in X-Ray/EUV Optics and Components XIV

14 August 2019 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XIII

20 August 2018 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XII

8 August 2017 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XI

31 August 2016 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components X

11 August 2015 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components IX

19 August 2014 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components VIII

26 August 2013 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components VII

13 August 2012 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components VI

22 August 2011 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components V

2 August 2010 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components IV

3 August 2009 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components III

11 August 2008 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components II

27 August 2007 | San Diego, California, United States

Advances in X-Ray/EUV Optics, Components, and Applications

14 August 2006 | San Diego, California, United States

X-Ray Sources and Optics

2 August 2004 | Denver, Colorado, United States

Showing 5 of 21 Conference Committees

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