Dr. Thierry Bigault Profile

Dr. Thierry Bigault

at Institute Laue-Langevin

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 31 August 2005 Paper

Christine Borel, Christian Morawe, Eric Ziegler, Thierry Bigault, Jean-Yves Massonnat, Jean-Christophe Peffen, Emilie Debourg

Proceedings Volume 5918, 591801 (2005) https://doi.org/10.1117/12.613873

KEYWORDS: Reflectivity, Annealing, Multilayers, Heat treatments, Data modeling, Synchrotron radiation, Ruthenium, X-rays, Synchrotrons, Interfaces

Proceedings Article | 23 December 2003 Paper

Nikolay Artemiev, Jaromir Hrdy, Thierry Bigault, Joanna Hoszowska, Sergey Peredkov

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.504730

KEYWORDS: Crystals, Surface finishing, X-rays, X-ray diffraction, Reflectivity, Diffraction, Polishing, Silicon, Monochromators, Manufacturing

Proceedings Article | 23 December 2003 Paper

Thierry Bigault, Eric Ziegler, Christian Morawe, Robert Hustache, Jean-Yves Massonnat, Gerard Rostaing

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.515980

KEYWORDS: Monochromators, Crystals, Laser crystals, Reflectivity, Silicon, Absorption, Sensors, Ruthenium, Synchrotron radiation, Photonic crystals

Proceedings Article | 24 December 2002 Paper

Eric Ziegler, Christian Morawe, Igor Kozhevnikov, T. Bigault, Claudio Ferrero, A. Tallandier

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455690

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Synchrotrons, Hard x-rays, X-ray optics, Astrophysics, Crystals, Optics manufacturing

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Keywords/Phrases