Dr. Sepehr Razi
at Urmia Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 June 2017 Paper
H. Ahmadi Rashtabadi, M. Mollabashi, S. Razi
Proceedings Volume 10329, 103293T (2017) https://doi.org/10.1117/12.2270102
KEYWORDS: Scanning electron microscopy, Reflectivity, Power meters, Direct methods, Laser systems engineering, Light scattering, Scattering, Atomic force microscopy, Femtosecond phenomena, Laser scattering, Process control, Scanning tunneling microscopy, Cameras, Optical testing

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