Dr. Siegfried Nau
at Fraunhofer EMI
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 January 2019 Paper
S. Moser, S. Nau, M. Wickert
Proceedings Volume 11051, 110510O (2019) https://doi.org/10.1117/12.2525447
KEYWORDS: X-rays, X-ray imaging, Error analysis, Sensors, X-ray detectors, 3D image processing, Visualization, Kinematics, Image processing, Data fusion

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