Roei Ohayon
at SCD SemiConductor Devices
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 May 2019 Presentation + Paper
R. Gazit, D. Chen, G. Gershon, A. Karabchevsky, Z. Kiblitski, O. Magen, T. Markovitz , R. Ohayon, O. Rozenberg, K. Rozenshein, N. Syrel, I. Vladovsky, M. Weinstein, I. Shtrichman, S. Riabzev
Proceedings Volume 11002, 110021W (2019) https://doi.org/10.1117/12.2517745
KEYWORDS: Sensors, Nonuniformity corrections, Image enhancement, Imaging systems, Image processing, Mid-IR, Video processing

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