La0.7Sr0.3MnO3 is a strongly correlated complex oxide. There is limited information about La0.7Sr0.3MnO3 thin films’ transient reflectivity (TR), where differences in ultra-fast dynamics due to surface and interface effects are expected. By decreasing the film thickness, additional energy states emerge, providing extra relaxation channels. Due to the reduced absorption in thin films, observing the effects of these extra states in TR signal is challenging, especially in a hole doped system such as La0.7Sr0.3MnO3. Moreover, in lower thicknesses, sinusoidal behavior superimposed on the TR signal is not analyzable by Fourier transforms. Wavelet transforms are perfect tools to analyze these fast-vanishing oscillations.
Complex oxide thin films, such as La0.7Sr0.3MnO3 (LSMO), are widely studied for a variety of applications. Transient reflectivity (TR) measurements on LSMO indicate enhanced surface recombination of charge carriers in films less than 20 nm in thickness. Oxygen growth pressure variation illustrates that higher oxygen pressures provide more electron dominance in the system, and producing a larger band filling effect which eventually results in higher excitations. Wavelet analysis can distinguish abrupt oscillatory modes with close energy ranges and have been introduced as a method to study sound velocities in ultra-thin films.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.