Using Pulsed Laser Deposition (PLD), Zr films were deposited on silicon with laser wavelengths of 1064 nm and 532 nm, at substrate temperatures of 25 °C, 300 °C, and 500 °C, and fluences of 0.25, 0.5, and 1.0 J/cm2. The 1064 nm wavelength yielded smoother films, with surface roughness growing at higher fluences. The 300 °C temperature was ideal for crystal quality. Analyses through XRD, SEM, and AFM showed unique morphologies due to laser variables. Computations using a thin film growth model matched the empirical data, underscoring the factors critical to Zr film deposition and guiding PLD optimization for superior film quality.
When piezoelectric laminates undergo large deformations, exhibiting a nonlinear stress-strain behavior, and the longitudinal vibrations are not neglected, linear models of piezoelectric laminates fail to represent and predict the governing dynamics. These large deformations are pronounced in certain applications such as energy harvesting. In this paper, first, a consistent variational approach is used by considering nonlinear elasticity theory to derive equations of motion for a three-layer piezoelectric laminate where the interactions of layers are modeled by the Rao-Nakra sandwich beam theory. The resulting equations of motion form into an unbounded infinite dimensional bilinear control system with nonlinear boundary conditions. The corresponding state-space formulation is shown to be well-posed in the natural energy space. With a particular choice of nonlinear feedback controllers, based on the nonlinearity of the model, the system dynamics can be stabilized to the equilibrium. Stabilization results are presented through the filtered semi-discrete Finite Difference approximations, and these results are compared to the ones of the linearized model
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