Dr. Mark R. Kozlowski Profile

Dr. Mark R. Kozlowski

Sr. Dir. R&D Programs at Viavi Solutions Inc

SPIE Involvement:

Author

Publications (76)

Proceedings Article | 8 May 2018 Presentation + Paper

Spectral performance and durability of dual-band infrared antireflection coatings on 3rd Gen lens substrates

Chris Piazzo, Alexis Weckel, Karen Hendrix, Mark Kozlowski

Proceedings Volume 10627, 106270I (2018) https://doi.org/10.1117/12.2307042

KEYWORDS: Coating, Antireflective coatings, Germanium, Transmittance, Forward looking infrared, Mid-IR, Long wavelength infrared, Infrared radiation

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Proceedings Article | 9 April 2002 Paper

Methods for mitigating surface damage growth in NIF final optics

Lawrence Hrubesh, Mary Norton, William Molander, Eugene Donohue, Stephen Maricle, Bernie Penetrante, Raymond Brusasco, Walter Grundler, Jim Butler, Jeff Carr, R. Hill, Leslie Summers, Michael Feit, Alexander Rubenchik, Michael Key, Paul Wegner, Alan Burnham, Lloyd Hackel, Mark Kozlowski

Proceedings Volume 4679, (2002) https://doi.org/10.1117/12.461723

KEYWORDS: Silica, Carbon dioxide lasers, Etching, National Ignition Facility, Laser induced damage, Plasma, Carbon dioxide, Wet etching, Fluorine, Contamination

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Proceedings Article | 9 April 2002 Paper

Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm

Stavros Demos, Mike Nostrand, Michael Staggs, Christopher Carr, Douglas Hahn, Mark Kozlowski, Lynn Sheehan, Colin Battersby, Alan Burnham

Proceedings Volume 4679, (2002) https://doi.org/10.1117/12.461715

KEYWORDS: Luminescence, Light scattering, Microscopy, Laser damage threshold, Crystals, Surface finishing, Laser induced damage, Polishing, Plasma, Contamination

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Proceedings Article | 12 April 2001 Paper

Chemical etch effects on laser-induced surface damage growth in fused silica

Lawrence Hrubesh, Mary Norton, William Molander, Paul Wegner, Michael Staggs, Stavros Demos, Jerald Britten, Leslie Summers, Edward Lindsey, Mark Kozlowski

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425054

KEYWORDS: Etching, Luminescence, Silica, Wet etching, Laser induced damage, Scanning electron microscopy, Ultraviolet radiation, HF etching, Hydrogen fluoride lasers, Oxygen

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Proceedings Article | 12 April 2001 Paper

Nature of damage in fused silica induced by high-fluence 3-omega 355-nm laser pulses, a multiscale morphology microstructure, and defect chemistry study

Joe Wong, D. Haupt, John Kinney, J. Ferriera, Ian Hutcheon, Stavros Demos, Mark Kozlowski

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425007

KEYWORDS: Silica, Surface finishing, Chemistry, Silicon, Scanning electron microscopy, Transmission electron microscopy, X-rays, Polishing, Laser induced damage, Tomography

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Proceedings Article | 12 April 2001 Paper

Growth of laser-initiated damage in fused silica at 351 nm

Mary Norton, Lawrence Hrubesh, Zhouling Wu, Eugene Donohue, Michael Feit, Mark Kozlowski, David Milam, Kurt Neeb, William Molander, Alexander Rubenchik, Walter Sell, Paul Wegner

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425055

KEYWORDS: Laser induced damage, Silica, UV optics, Ultraviolet radiation, Sol-gels, Antireflective coatings, Laser marking

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Proceedings Article | 12 April 2001 Paper

Mechanisms to explain damage growth in optical materials

Stavros Demos, Mark Kozlowski, Michael Staggs, Lloyd Chase, Alan Burnham, Harry Radousky

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425051

KEYWORDS: Plasma, Luminescence, Laser induced damage, Light scattering, Silica, Ionization, Laser irradiation, Pulsed laser operation, Laser scattering, Image processing

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Proceedings Article | 26 October 2000 Paper

Effect of vacuum on the occurrence of UV-induced surface photoluminescence, transmission loss, and catastrophic surface damage

Alan Burnham, Michael Runkel, Stavros Demos, Mark Kozlowski, Paul Wegner

Proceedings Volume 4134, (2000) https://doi.org/10.1117/12.405349

KEYWORDS: Luminescence, Reflectivity, Transmittance, Silica, Laser induced damage, Visible radiation, Ultraviolet radiation, Sol-gels, CCD cameras, Absorption

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Proceedings Article | 25 October 2000 Paper

Properties of modified silica detected within laser-induced damage sites

Mark Kozlowski, Stavros Demos

Proceedings Volume 4102, (2000) https://doi.org/10.1117/12.405274

KEYWORDS: Silica, Laser induced damage, Luminescence, Raman spectroscopy, Oxygen, Absorption, Silicon, Surface finishing, 3D modeling, Raman scattering

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Proceedings Article | 7 June 2000 Paper

Spectroscopic investigation of SiO2 surfaces of optical materials for high-power lasers

Stavros Demos, Lynn Sheehan, Mark Kozlowski

Proceedings Volume 3933, (2000) https://doi.org/10.1117/12.387569

KEYWORDS: Laser induced damage, Luminescence, Silica, Surface finishing, Raman spectroscopy, Polishing, Raman scattering, High power lasers, Spectroscopy, Laser applications

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Proceedings Article | 3 March 2000 Paper

Luminescence investigation of SiO2 surfaces damaged by 0.35-nm laser illumination

Mark Kozlowski, Colin Battersby, Stavros Demos

Proceedings Volume 3902, (2000) https://doi.org/10.1117/12.379338

KEYWORDS: Silica, Luminescence, Laser induced damage, Silicon, Surface finishing, Oxygen, Plasma, Polishing, Particles, Absorption

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Proceedings Article | 23 July 1999 Paper

Statistical description of laser damage initiation in NIF and LMJ Optics at 355 nm

Michael Feit, Francois Genin, Alexander Rubenchik, Lynn Sheehan, Sheldon Schwartz, Mark Kozlowski, Jean DiJon, Pierre Garrec, Jean Hue

Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354232

KEYWORDS: National Ignition Facility, Laser induced damage, Laser damage threshold, Silica, Statistical analysis, Glasses, Polishing, Gaussian beams, Raster graphics, Data modeling

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Proceedings Article | 23 July 1999 Paper

3-w damage threshold evaluation of final optics components using Beamlet Mule and off-line testing

Mark Kozlowski, Stephen Maricle, Ron Mouser, Sheldon Schwartz, Paul Wegner, Timothy Weiland

Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354241

KEYWORDS: Inspection, National Ignition Facility, Laser induced damage, Data modeling, Polishing, Laser damage threshold, Optical inspection, Silica, UV optics, Statistical modeling

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Proceedings Article | 23 July 1999 Paper

Vendor-based laser damage metrology equipment supporting the National Ignition Facility

Sheldon Schwartz, Richard Jennings, James Kimmons, Ron Mouser, Carolyn Weinzapfel, Mark Kozlowski, Christopher Stolz, Jack Campbell

Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354216

KEYWORDS: Metrology, National Ignition Facility, Laser induced damage, Optical coatings, Optical testing, Laser damage threshold, Plasma, Diagnostics, Laser metrology, Platinum

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Proceedings Article | 7 April 1999 Paper

Single-beam photothermal microscopy: a new diagnostic tool for optical materials

Zhouling Wu, Michael Feit, Mark Kozlowski, Jean-Yves Natoli, Alexander Rubenchik, Lynn Sheehan, Ming Yan

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344423

KEYWORDS: Laser scattering, Scattering, Laser beam diagnostics, Laser induced damage, Signal detection, Microscopy, Modulation, Spatial resolution, Defect detection, Sensors

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Proceedings Article | 7 April 1999 Paper

Current 3-omega large optic test procedures and data analysis for the quality assurance of National Ignition Facility optics

Sheldon Schwartz, Michael Feit, Mark Kozlowski, Ron Mouser

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344417

KEYWORDS: National Ignition Facility, Data analysis, Raster graphics, Optical testing, Data modeling, Laser induced damage, Metrology, Photomicroscopy, Gaussian beams, Resistance

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Proceedings Article | 7 April 1999 Paper

Effects of wet etch processing on laser-induced damage of fused silica surfaces

Colin Battersby, Lynn Sheehan, Mark Kozlowski

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344412

KEYWORDS: Etching, Polishing, Air contamination, Wet etching, Silica, Laser damage threshold, Surface finishing, Laser induced damage, Microscopy, Raster graphics

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Proceedings Article | 7 April 1999 Paper

Automated damage test facilities for materials development and production optic quality assurance at Lawrence Livermore National Laboratory

Lynn Sheehan, Sheldon Schwartz, Colin Battersby, Richard Dickson, Richard Jennings, James Kimmons, Mark Kozlowski, Stephen Maricle, Ron Mouser, Michael Runkel, Carolyn Weinzapfel

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344447

KEYWORDS: Diagnostics, Optics manufacturing, Raster graphics, Optical testing, National Ignition Facility, Optical components, Silica, Laser damage threshold, Laser development, Laser glasses

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Proceedings Article | 7 April 1999 Paper

Laser damage performance of fused silica optical components measured on the beamlet laser at 351 nm

Mark Kozlowski, Ron Mouser, Stephen Maricle, Paul Wegner, Timothy Weiland

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344415

KEYWORDS: Silica, Laser induced damage, Lenses, National Ignition Facility, Inspection, Laser optics, Optical testing, Photomicroscopy, Data modeling, Sol-gels

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Proceedings Article | 7 April 1999 Paper

Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings

Zhouling Wu, Michael Feit, Mark Kozlowski, Alexander Rubenchik, Lynn Sheehan

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344422

KEYWORDS: Laser scattering, Scattering, Laser beam diagnostics, Absorption, Modulation, Laser induced damage, Nondestructive evaluation, Signal detection, Optical coatings, Surface finishing

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Proceedings Article | 7 April 1999 Paper

Extrapolation of damage test data to predict performance of large-area NIF optics at 355 nm

Michael Feit, Alexander Rubenchik, Mark Kozlowski, Francois Genin, Sheldon Schwartz, Lynn Sheehan

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344413

KEYWORDS: National Ignition Facility, Laser induced damage, Statistical analysis, Laser damage threshold, Gaussian beams, Silica, Beam shaping, Raster graphics, Analytical research, Polishing

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Proceedings Article | 7 April 1999 Paper

Characterization of surface and subsurface defects in optical materials using near-field evanescent wave (Abstract Only)

Ming Yan, Stan Oberhelman, Wigbert Siekhaus, Zhouling Wu, Lynn Sheehan, Mark Kozlowski

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344425

KEYWORDS: Near field scanning optical microscopy, Laser induced damage, Optical properties, Near field, Absorption, Optical coatings, Near field optics, Atomic force microscopy, Silica, Surface finishing

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Proceedings Article | 24 June 1998 Paper

Laser conditioning methods of hafnia silica multilayer mirrors

Christopher Stolz, Lynn Sheehan, Stephen Maricle, Sheldon Schwartz, Mark Kozlowski, Richard Jennings, Jean Hue

Proceedings Volume 3264, (1998) https://doi.org/10.1117/12.311905

KEYWORDS: Mirrors, Coating, Laser induced damage, Silica, Optics manufacturing, National Ignition Facility, Laser damage threshold, Hafnium, Plasma, Multilayers

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Large aperture multilayer hafnia silica high reflector coatings at 1064 nm, deposited by reactive electron-beam deposition, were prepared to examine different laser conditioning methods for manufacturing high fluence optics in the National Ignition Facility. Laser conditioning is a process where the damage threshold of the coating is increased or the damage that is created is minimized so that it does not grow upon further irradiation. Two laser conditioning methods were examined for coatings deposited from only oxide starting materials. Off-line laser conditioning consists of raster scanning a mirror past a 1 mm diameter Gaussian beam over the entire clear aperture; a process that takes approximately 24 hours per scan. On-line laser conditioning consisted of a large aperture 300 mm X 300 mm beam from the Beamlet laser that irradiated the entire full clear aperture of a series of mirrors; a process that was limited by a 2 - 4 hour shot rate. In both cases a six-step process was used with the mirror first irradiated at a low fluence, then successively higher fluences increased in equal increments up to the peak laser operating fluence. Mirrors that were only partially laser conditioned damaged catastrophically while fully conditioned mirrors survived fluences exceeding the safe operating Beamlet fluence. An alternative off-line laser conditioning method was examined for coatings deposited from hafnia or metallic hafnium sources. Single-step laser conditioning consists of off-line raster scanning an optic at the peak operating fluence, thus decreasing the laser conditioning cost by reducing the number of scans and required laser conditioning stations to process all the mirrors for the National Ignition Facility. Between pulses the optic is stepped approximately one fourth of the 1/e² Gaussian beam diameter so each area of the coating is irradiated by different segments of the beam starting at a low fluence at the outer edge of the beam diameter and increasing to the peak fluence in the center of the beam. The one-step conditioning results appear positive, but the influence of the coating improvements due to the metallic hafnium process on laser conditioning is undefined.