Lead-sulphide films were deposited on glass substrates by XeCl(308 nm) excimer laser ablation of lead target in H2S ambient gas. Series of pulses at the repetition rate of 1 HZ were directed to the target surface. The pulse energy was set at about 200 mJ/pulse. Pulse duration was about 60 ns. The deposited films were characterized by absorption spectroscopy, scanning electron microscopy (SEM) and x-ray photoelectron spectroscopy (XPS).
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