Prof. Joon Seop Kwak Profile

Prof. Joon Seop Kwak

at Korea Institute of Energy Technology (KENTECH)

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Author

Publications (5)

Proceedings Article | 21 March 2023 Poster

Influence of forward-current stress on the generation of deep-level traps in InGaN/GaN blue micro-LEDs

A. B. M. Hamidul Islam, Tae Kyoung Kim, Yu-Jung Cha, Jae Won Seo, Jiun Oh, Jong-In Shim, Dong-Soo Shin, Joon Seop Kwak

Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2655656

KEYWORDS: Quantum wells, Light emitting diodes, External quantum efficiency, Dry etching, Optoelectronics, Wet etching, Gallium

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Proceedings Article | 7 March 2022 Poster

Size-dependent variation of efficiency in InGaN-based flip-chip near ultraviolet and blue micro light-emitting diodes

A. B. M. Hamidul Islam, Tae Kyoung Kim, Yu-Jung Cha, Jae Won Seo, Dong-Soo Shin, Jong-In Shim, Joon Seop Kwak

Proceedings Volume PC12022, PC1202217 (2022) https://doi.org/10.1117/12.2625718

KEYWORDS: Near ultraviolet, Light emitting diodes, External quantum efficiency, Etching, Resistance, Electroluminescence, Optical testing, Optoelectronics, Semiconducting wafers

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Proceedings Article | 5 March 2022 Poster

Precise performances of InGaN/GaN-based sidewall emitted light-emitting diodes for ultrathin backlight unit

Tae Kyoung Kim, A. B. M. Hamidul Islam, Yu-Jung Cha, Jae Won Seo, Joon Seop Kwak

Proceedings Volume PC12001, PC120011M (2022) https://doi.org/10.1117/12.2625709

KEYWORDS: Reflectors, Light emitting diodes, Silver, Reflectivity, Optoelectronics, LCDs, Diffusers, Zinc oxide, Solid state physics, Nanorods

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Proceedings Article | 5 March 2021 Presentation + Paper

GaN blue vertical-cavity surface-emitting lasers using conductive nanoporous distributed Bragg reflectors

Rami Elafandy, Jin-Ho Kang, Bingjun Li, Tae Kyoung Kim, Joon Seop Kwak, Jung Han

Proceedings Volume 11706, 117061F (2021) https://doi.org/10.1117/12.2577986

KEYWORDS: Ultraviolet radiation, Gallium nitride, Optoelectronics, Optoelectronic devices, Distributed Bragg reflectors, Vertical cavity surface emitting lasers, Optics manufacturing, Wafer testing, Projection devices, UV optics

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Proceedings Article | 10 March 2020 Presentation

Strain relaxation caused by defects in InGaN-based multiple-quantum-well near-ultraviolet light-emitting diodes investigated by macroscopic characterization (Conference Presentation)

A.B.M. Hamidul Islam, Dong-Soo Shin, Joon Seop Kwak, Jong-In Shim

Proceedings Volume 11280, 1128014 (2020) https://doi.org/10.1117/12.2544036

KEYWORDS: Near ultraviolet, Light emitting diodes, Microscopy, Crystals, Optoelectronics

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