Dr. David W. Doerr
Product Development Engineer
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 17 April 2012 Paper
Alexander Figliolini, Michael Archuletta, Jeff LeClaire, David Brinkley, David Doerr, Roy White, Ron Bozak, David Lee
Proceedings Volume 8352, 83520R (2012) https://doi.org/10.1117/12.918378
KEYWORDS: Air contamination, Photomasks, Pellicles, Particles, Reticles, Semiconducting wafers, Image processing, Lithography, Inspection, Quartz

Proceedings Article | 16 October 2006 Paper
Proceedings Volume 6399, 639908 (2006) https://doi.org/10.1117/12.690618
KEYWORDS: Aerosols, Polarization, Femtosecond phenomena, Silica, Mode locking, Beam splitters, Atmospheric particles, Pulsed laser operation, Clouds, Continuous wave operation

Proceedings Article | 21 January 2006 Paper
Proceedings Volume 6103, 610318 (2006) https://doi.org/10.1117/12.648298
KEYWORDS: Diffraction, Pulsed laser operation, Ultrafast phenomena, Continuous wave operation, Femtosecond phenomena, Optical simulations, Near field diffraction, Near field optics, Silica

Proceedings Article | 12 April 2005 Paper
Proceedings Volume 5713, (2005) https://doi.org/10.1117/12.593956
KEYWORDS: Silicon, Particles, Excimer lasers, Toxic industrial chemicals, Aluminum, Thin films, FT-IR spectroscopy, Semiconductor lasers, Silicon carbide, Nitrogen

Proceedings Article | 13 September 2002 Paper
Proceedings Volume 4760, (2002) https://doi.org/10.1117/12.482107
KEYWORDS: Femtosecond phenomena, Silicon, Scanning electron microscopy, Particles, Laser drilling, Semiconductor lasers, Metals, Laser ablation, Plasma, Laser systems engineering

Showing 5 of 6 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top