Presentation + Paper
30 September 2024 Ultrafast EUV microscopy of self-assembled nanomaterials
Author Affiliations +
Abstract
We report the design of an Extreme Ultraviolet microscope relying on Ultrafast Ptychographic Coherent Diffractive Imaging. This compact tool is capable of imaging the functional response of interfaces and heterogeneous nanomaterials activated by light pulses, across length scales, with high spatio-temporal resolutions, and with exquisite contrast to their chemical composition and to their morphology.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Carmelo Grova, Dmitry Karpov, Nicola Giani, Charles S. Bevis, Daniel E. Adams, and Giulia F. Mancini "Ultrafast EUV microscopy of self-assembled nanomaterials", Proc. SPIE 13127, Physical Chemistry of Semiconductor Materials and Interfaces XXIII, 1312706 (30 September 2024); https://doi.org/10.1117/12.3027994
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Extreme ultraviolet

Ultrafast phenomena

Microscopes

Coherence imaging

Nanomaterials

Diffraction

Optical coherence

Back to Top