PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
We report the design of an Extreme Ultraviolet microscope relying on Ultrafast Ptychographic Coherent Diffractive Imaging. This compact tool is capable of imaging the functional response of interfaces and heterogeneous nanomaterials activated by light pulses, across length scales, with high spatio-temporal resolutions, and with exquisite contrast to their chemical composition and to their morphology.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Carmelo Grova, Dmitry Karpov, Nicola Giani, Charles S. Bevis, Daniel E. Adams, Giulia F. Mancini, "Ultrafast EUV microscopy of self-assembled nanomaterials," Proc. SPIE 13127, Physical Chemistry of Semiconductor Materials and Interfaces XXIII, 1312706 (30 September 2024); https://doi.org/10.1117/12.3027994