Paper
22 October 2010 Study of quantitative identification of infrared thermal wave testing based on BP neural networks
Zhang Wei, Liu Tao, Yangzheng Wei, Zhangrui Min
Author Affiliations +
Abstract
In order to resolve the problem of quantitative identifying, in pulsed thermography, taking the highest temperature difference and the best testing time as input, and taking defect depth and diameter as output, made use of BP Neural Networks to achieve it, and it was done. According to result, when testing value was in area of swatch, identifying precision was high, and error is less than 3.5%. The feasibility of BP Neural Networks was validated, and it has very important meaning to quantitative identifying of factual application.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhang Wei, Liu Tao, Yangzheng Wei, and Zhangrui Min "Study of quantitative identification of infrared thermal wave testing based on BP neural networks", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76580Z (22 October 2010); https://doi.org/10.1117/12.866394
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KEYWORDS
Neural networks

Thermography

Infrared radiation

Thermal modeling

Nondestructive evaluation

3D modeling

Composites

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