Dr. Maurizio Vannoni
Researcher at European XFEL GmbH
SPIE Involvement:
Author
Publications (31)

Proceedings Article | 3 October 2023 Presentation + Paper
Proceedings Volume 12695, 1269507 (2023) https://doi.org/10.1117/12.2675732
KEYWORDS: Coating, Mirrors, Parabolic mirrors, Mirror surfaces, X-rays, Surface finishing, Reflection, Metrology, Silicon, Polishing

Proceedings Article | 3 October 2023 Presentation + Paper
Silja Schmidtchen, Idoia Freijo Martin, Antje Trapp, Maurizio Vannoni, Harald Sinn
Proceedings Volume 12694, 126940E (2023) https://doi.org/10.1117/12.2677287
KEYWORDS: Mirrors, Vibration, Vacuum chambers, X-rays, Imaging systems, Equipment, Laser Doppler velocimetry, Optical components, Doppler effect

Proceedings Article | 9 September 2019 Paper
M. Vannoni, A. Zozulya, I. Frejio Martin, S. Schmidtchen, A. Madsen, M. Störmer
Proceedings Volume 11109, 111090B (2019) https://doi.org/10.1117/12.2530504
KEYWORDS: Mirrors, Coating, Finite element methods, Polishing, Metrology, X-rays, Grazing incidence

Proceedings Article | 9 September 2019 Paper
S. Schmidtchen, M. Vannoni, I. Freijo-Martin, D. La Civita, H. Sinn
Proceedings Volume 11109, 1110904 (2019) https://doi.org/10.1117/12.2530635
KEYWORDS: Mirrors, X-rays, Metrology, Kinematics, X-ray diffraction, Fizeau interferometers, Polishing

Proceedings Article | 9 September 2019 Paper
G. Mercurio, C. Broers, R. Carley, J. T. Delitz, N. Gerasimova, L. Le Guyarder, L. Mercadier, A. Reich, J. Schlappa, M. Teichmann, A. Yaroslavtsev, M. Cascella, K. Setoodehnia, M. Schneider, B. Pfau, S. Eisebitt, V. Vozda, V. Hájková, L. Vyšín, T. Burian, J. Chalupský, L. Juha, S. G. Alcock, I. Nistea, D. La Civita, H. Sinn, M. Vannoni, A. Scherz
Proceedings Volume 11109, 111090F (2019) https://doi.org/10.1117/12.2530725
KEYWORDS: Mirrors, X-rays, Free electron lasers, Sensors, Computer programming, Diffraction gratings, Scattering, Spectroscopes, Metrology

Showing 5 of 31 publications
Conference Committee Involvement (6)
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Adaptive X-Ray Optics V
21 August 2018 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Adaptive X-Ray Optics IV
28 August 2016 | San Diego, California, United States
Showing 5 of 6 Conference Committees
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