Dr. Jue Wang Profile

Dr. Jue Wang

Leading Scientist at Corning Advanced Optics

SPIE Involvement:

Fellows Committee | Conference Program Committee | Author

Area of Expertise:

Optical Coatings R&D&E&M , Laser-Induced Damage of Optical Materials , Optical Materials, Surfaces and Interfaces , Laser Optics , Precision Optics , A&D Optics

Websites:

Company Website

Profile Summary

Dr. Jue Wang is a leading scientist in optical surfaces, thin films, and coating technologies for Corning Advanced Optics, an SPIE fellow endorsed in 2023.
Jue chaired OPTICA Thin Film Technical Group (2018-2021), served SPIE and OPTICA conference committees, including Optical Interference Coatings Conference (OIC). Jue also served as the topic editor of High-Power Laser Science and Engineering (2014-2017). Jue received dozens of recognitions and awards including Corning Foundation Excellence in Volunteerism in 2019. Jue pursues fundamental understanding, while cherishing industry technical innovation. His adventure leads to 30+ US patents, 100+ technical publications.
Before joining Corning in 2000, he was a full Professor of Physics at Tongji University. He was German Volkswagen and DAAD research fellows at Wuerzburg University. He received his BS and Ph.D. in physics and optics from Fudan University and Shanghai Institute of Technical Physics, Chinese Academy of Sciences.

Publications (44)

SPIE Journal Paper | 28 August 2024

High-refractive index glass wafers for waveguide-based augmented reality wearables

Jue Wang, Chuan Ni, Gen (Simon) Yang, Sam Lu, Daniel McGill, Keith Becken, Omkar Supekar, Karan Mehrotra, John T. Keech, Mark Krol

OE, Vol. 63, Issue 09, 091608, (August 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.9.091608

KEYWORDS: Semiconducting wafers, Glasses, Waveguides, Refractive index, Augmented reality, Wafer level optics, Reflectivity, Antireflective coatings, Coating thickness, Total internal reflection

Read Abstract +

Advantages of high-refractive index (HRI) glass wafers for augmented reality wearables (ARWs) include high transparency, low birefringence and total thickness variation, high durability and optical quality, high mechanical stability, stiffness, and geometrical stability. ARWs enable users to see computer-generated images overlaid on top of normal view. ARWs give the user an enhanced experience and are hands-free. Waveguide technology uses a combination of diffractive or reflective gratings and HRI glass wafers to transfer or project images from the light source (projector) to the user’s eye through total internal reflection (TIR). With all these advantages, glass is truly one of the world’s most transformative materials. To make the waveguide-based devices a reality, Corning has developed a series of HRI glass wafers with a diameter of up to Φ300 mm. Corning augmented reality solution (ARS) provides high-throughput metrology expertise, fully automated laser cutting technology, and the capability to capture the total thickness variation over the entire glass wafers using a frequency stepping interferometer. In this paper, we first conducted optical characterization of uncoated high-refractive index glass wafers. Corning® Tropel® Flatmaster® MSP-300 was used to characterize the wafer profile properties of manufactured high-refractive index glass wafers. A variable angle spectroscopic ellipsometer (VASE) J.A. Woollam M-2000 was applied to evaluate the refractive index homogeneity of the high-refractive index glass wafers. A Metricon 2010/M system was used to measure the losses of optical waveguide at a wavelength of 409 nm, 448 nm, and 519 nm, respectively. A refractive index homogeneity of 99.976% and an optical thickness homogeneity of 99.979% were realized. Finally, an anti-reflective coating over a broad visible spectral range was added on top of a glass wafer for surface reflectance suppression. SiO2 and Nb2O5 were selected as low- and high-refractive index coating materials. The anti-reflective coating leads to a visible reflectance below 0.5% with a desired neutral aesthetic appearance.

Proceedings Article | 7 June 2024 Presentation + Paper

Presentation + Paper

Theoretical principles and design practices for edge filters and coatings

Yongli Xu, Robert Benson, Jue Wang, Jingyu Lao, Rekha Doshi, Shane Stephens, Joseph Kunick

Proceedings Volume 13042, 130420B (2024) https://doi.org/10.1117/12.3013710

KEYWORDS: Tunable filters, Design, Optical filtering, Optical filters, Silicon, Optical coatings, Coating thickness, Germanium, Deep ultraviolet

Read Abstract +

SPIE Journal Paper | 18 January 2024

Corrosion-resistant antireflective coatings on ZnS for short- to mid-wavelength IR outer window applications

Yongli Xu, Nick Bredberg, Jason Ballou, Jue Wang

OE, Vol. 63, Issue 01, 017103, (January 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.1.017103

KEYWORDS: Coating, Fiber optic gyroscopes, Silicon, Antireflective coatings, Zinc sulfide, Zinc selenide, Corrosion, Reflection, Ions, Design

Read Abstract +

Proceedings Article | 24 November 2023 Presentation + Paper

Presentation + Paper

Laser-induced damage of CaF2 optics at 193 nm

Jue Wang, Gerald Cox, Keith Donohue, Ronald Davis, Ying Shi, Cody Cushman, Aram Rezikyan, Galan Moore, James Tingley, Keith Becken, Matthew Ross, Michael Thomas

Proceedings Volume 12726, 127260G (2023) https://doi.org/10.1117/12.2685720

KEYWORDS: Laser induced damage, Absorption, Accelerated life testing, Optical surfaces, Laser optics, Light absorption, X-rays, Surface finishing, Polishing

Read Abstract +

Proceedings Article | 24 November 2023 Presentation + Paper

Presentation + Paper

Laser-induced damage of dielectric-enhanced surface-modified single-point-diamond-turned Al-6061 multiband mirrors

Jue Wang, Leonard Wamboldt, Ronald Davis, Ying Shi, Todd Heck, Craig Ungaro, A. Boh Ruffin, Michael Thomas

Proceedings Volume 12726, 1272608 (2023) https://doi.org/10.1117/12.2685665

KEYWORDS: Laser induced damage, Laser damage threshold, Dielectric mirrors, Mirror surfaces, Aluminum, Reflectivity, Optical surfaces, Mid-IR, Alloys, Visible radiation

Read Abstract +

Proceedings Article | 24 November 2023 Paper

Paper

Shockwave and crack monitoring following nonlinear absorption with picosecond time-resolved microscopic imaging

Matthew Ross, Jue Wang

Proceedings Volume 12726, 127260Q (2023) https://doi.org/10.1117/12.2685245

KEYWORDS: Picosecond phenomena, Absorption, Ultrafast phenomena, Ultrafast lasers, Ultrafast imaging, Spatial resolution, Laser irradiation, Light absorption, Laser-matter interactions, Image resolution

Read Abstract +

Proceedings Article | 14 June 2023 Presentation + Paper

Presentation + Paper

Corrosion resistance environment durable SWIR-MWIR AR coatings

Yongli Xu, Nick Bredberg, Jason Ballou, Jue Wang, Lance Kim

Proceedings Volume 12530, 125300D (2023) https://doi.org/10.1117/12.2663354

KEYWORDS: Optical coatings, Silicon, Corrosion, Zinc selenide, Coating stress, Antireflective coatings, Glues, Resistance, Mid-IR

Read Abstract +

Proceedings Article | 17 March 2023 Presentation + Paper

Presentation + Paper

Surface and bulk damage resistance of calcium fluoride optics assessed by x-ray induced color centers

Jue Wang, François Piché, Eileen Fanning

Proceedings Volume 12402, 1240208 (2023) https://doi.org/10.1117/12.2650614

KEYWORDS: X-rays, Crystals, X-ray optics, Surface finishing, Resistance, Optical surfaces, Calcium, Fluoride, Color centers, Polishing

Read Abstract +

SPIE Journal Paper | 6 March 2023

Optical dispersion and bandgap of ultralow expansion glass

Jue Wang, Michael J. Campion

OE, Vol. 62, Issue 03, 037101, (March 2023) https://doi.org/10.1117/12.10.1117/1.OE.62.3.037101

KEYWORDS: Glasses, Semiconducting wafers, Wafer-level optics, Transmittance, Dispersion, Ultraviolet radiation, Refractive index, Data transmission, Data modeling, Light absorption

Read Abstract +

Proceedings Article | 2 December 2022 Presentation + Paper

Presentation + Paper

Hot-spot monitoring of ArF laser at HDC and high energy mode using low reflective beam splitter

Masoud Babaeian, Eric Mason, Jue Wang, Gerald Cox

Proceedings Volume 12300, 1230006 (2022) https://doi.org/10.1117/12.2641982

KEYWORDS: Beam splitters, Beam analyzers, Antireflective coatings, Excimer lasers, Laser induced damage, Laser applications, Coating

Read Abstract +

Proceedings Article | 27 May 2022 Presentation + Paper

Presentation + Paper

Temperature-dependent UV transparency of ultra-low expansion ULE glass

Jue Wang, Michael Campion

Proceedings Volume 12103, 121030I (2022) https://doi.org/10.1117/12.2625810

KEYWORDS: Glasses, Transmittance, Ultraviolet radiation, Absorption, Refractive index, Data modeling, UV optics, Transparency, Temperature metrology, Dispersion

Read Abstract +

Proceedings Article | 12 September 2021 Presentation + Paper

Presentation + Paper

Enhanced durable silver mirrors with ion beam assisted deposition

Jue Wang, Leonard Wamboldt, Jason Ballou, Timothy Soucy

Proceedings Volume 11872, 118720L (2021) https://doi.org/10.1117/12.2599905

KEYWORDS: Reflectivity, Silica, Silver, Coating, Mirrors, Ion beams, Data modeling, Ozone, Oxides, Ions

Read Abstract +

SPIE Journal Paper | 27 November 2020

ArF laser-induced damage of calcium fluoride windows with protected anti-reflection coatings

Jue Wang, Gerald Cox

OE, Vol. 60, Issue 03, 031007, (November 2020) https://doi.org/10.1117/12.10.1117/1.OE.60.3.031007

KEYWORDS: Laser induced damage, Antireflective coatings, Coating, Absorption, Calcium, Optical engineering, Interferometry, Surface finishing, Resistance, Pulsed laser operation

Read Abstract +

Proceedings Article | 27 June 2018 Paper

Paper

Investigation of Sc2O3 for high laser durability ultraviolet coating applications

Jing Du, Jue Wang, Gary Hart, Jean Francois Oudard

Proceedings Volume 10691, 1069112 (2018) https://doi.org/10.1117/12.2311330

KEYWORDS: Scandium, Antireflective coatings, Coating, Absorption, Transmittance, Ultraviolet radiation, Plasma, Refractive index, Reflectivity

Read Abstract +

Proceedings Article | 8 May 2018 Paper

Paper

Low auto-fluorescence broadband antireflection coatings for human genome sequencing optical platform

Jing Du, Jue Wang, Horst Schreiber, Jean Francois Oudard

Proceedings Volume 10627, 106270J (2018) https://doi.org/10.1117/12.2311319

KEYWORDS: Glasses, Optical coatings, Antireflective coatings, Imaging systems, Reflectivity, Objectives, Refractive index, Lens design, Thin film coatings

Read Abstract +

Proceedings Article | 8 May 2018 Paper

Paper

Silicon oxynitride based scratch resistant anti-reflective coatings

Jue Wang, Jonathan Bouchard, Gary Hart, Jean Francois Oudard, Charles Paulson, Paul Sachenik, James Price

Proceedings Volume 10627, 106270G (2018) https://doi.org/10.1117/12.2303679

KEYWORDS: Antireflective coatings, Reflectivity, Glasses, Silicon, Refractive index, Silicon films, Resistance, Oxygen, Optical coatings, Sputter deposition

Read Abstract +

Proceedings Article | 11 May 2017 Presentation + Paper

Presentation + Paper

Characterization of reactive plasma ion assisted HfO2 films for low loss optical coatings in the DUV and MWIR

Jue Wang, Michael Cangemi, Christopher Chinhong, Michael D'lallo, Jim Platten, Jean Francois Oudard, Leonard Wamboldt

Proceedings Volume 10181, 101810P (2017) https://doi.org/10.1117/12.2271889

KEYWORDS: Deep ultraviolet, Plasma, Ions, Mid-IR, Absorption, Optical properties, Optical coatings, Thin films, Refractive index, Hafnium, Hybrid fiber optics, Surface roughness, Reflectivity

Read Abstract +

Proceedings Article | 10 December 2016 Paper

Paper

Laser-induced damage of F-SiO2 protected fluoride based AR coating on a subsurface-damage-free CaF2 at 193nm

Jue Wang, Gerald Cox, Michael D'Lallo, Steven Vankerkhove, Jean Francois Oudard

Proceedings Volume 10014, 100140A (2016) https://doi.org/10.1117/12.2243783

KEYWORDS: Laser induced damage, Antireflective coatings, Optical coatings, Autoregressive models, Absorption, Optical interferometry, Surface finishing, Near field optics, Laser damage threshold, Resistance

Read Abstract +

Proceedings Article | 17 May 2016 Paper

Paper

HfO2/SiO2 multilayer based reflective and transmissive optics from the IR to the UV

Jue Wang, Gary Hart, Jean Francois Oudard, Leonard Wamboldt, Brian Roy

Proceedings Volume 9822, 98220Z (2016) https://doi.org/10.1117/12.2219752

KEYWORDS: Ultraviolet radiation, Multilayers, Reflectivity, Aluminum, Laser induced damage, UV optics, Silica, Mirrors, Transmittance, Coating

Read Abstract +

Proceedings Article | 24 September 2015 Paper

Paper

Surface assessment and mitigation of DUV optics

Jue Wang

Proceedings Volume 9628, 96280Y (2015) https://doi.org/10.1117/12.2190684

KEYWORDS: Surface finishing, Polishing, Plasma, Laser optics, Ions, Fluorine, Absorption, Refractive index, Reflectivity, Deep ultraviolet

Read Abstract +

Proceedings Article | 22 May 2015 Paper

Paper

Laser-induced damage threshold prediction of dielectric enhanced mirrors at 1064 nm

Jue Wang

Proceedings Volume 9453, 94530S (2015) https://doi.org/10.1117/12.2190662

KEYWORDS: Laser induced damage, Mirrors, Reflectivity, Aluminum, Laser damage threshold, Coating, Dielectrics, Multilayers, Scanning electron microscopy, Microscopy

Read Abstract +

Proceedings Article | 22 May 2015 Paper

Paper

Angle resolved backscatter of HfO2/SiO2 multilayer mirror at 1064 nm

Jue Wang, Sven Schröder, Marcus Trost, Matthias Hauptvogel, Angela Duparré

Proceedings Volume 9453, 94530T (2015) https://doi.org/10.1117/12.2190663

KEYWORDS: Backscatter, Multilayers, Light scattering, Mirrors, Scattering, Plasma, Coating, Scatter measurement, Atomic force microscopy, Optical testing

Read Abstract +

Proceedings Article | 24 June 2014 Paper

Paper

Laser damage resistant multiband high reflective optics

Angela Wang, Jue Wang, Michael D'lallo, Jim Platten, Brian Roy, Michael Orr, Joseph Crifasi

Proceedings Volume 9070, 90701B (2014) https://doi.org/10.1117/12.2050739

KEYWORDS: Laser induced damage, Reflectivity, Scanning electron microscopy, Aluminum, Laser damage threshold, Surface finishing, Coating, Atomic force microscopy, Microscopy, Laser drilling

Read Abstract +

Proceedings Article | 6 December 2011 Paper

Paper

HfO2/SiO2 enhanced diamond turned aluminum mirrors for IR laser optics

Jue Wang, Ronald Davis, Angela Wang, Horst Schreiber, Scott Wilkinson, Joseph Crifasi, Robert Felock

Proceedings Volume 8190, 819005 (2011) https://doi.org/10.1117/12.900226

KEYWORDS: Aluminum, Laser induced damage, Mirrors, Multilayers, Dielectrics, Scanning electron microscopy, Coating, Reflectivity, Particles, Diamond

Read Abstract +

Proceedings Article | 21 May 2011 Paper

Paper

Low-loss dual-wave laser optics coatings at 1060 nm and 530 nm

Jue Wang, Horst Schreiber

Proceedings Volume 8016, 80160Y (2011) https://doi.org/10.1117/12.883915

KEYWORDS: Plasma, Optical coatings, Multilayers, Ions, Laser optics, Scanning electron microscopy, Reflectivity, Atomic force microscopy, Silica, Second-harmonic generation

Read Abstract +

Proceedings Article | 31 December 2009 Paper

Paper

Optical coatings with ultralow refractive index SiO2 films

Jue Wang, Bin Zhou, Jun Shen, Guangming Wu

Proceedings Volume 7504, 75040F (2009) https://doi.org/10.1117/12.836252

KEYWORDS: Silica, Refractive index, Sol-gels, Nanostructuring, Antireflective coatings, Nanostructures, Silicon, Carbon dioxide, Optical coatings, Reflectivity

Read Abstract +

Proceedings Article | 20 December 2007 Paper

Paper

Extended lifetime of fluoride optics

Jue Wang, Colleen Clar, Horst Schreiber

Proceedings Volume 6720, 67200I (2007) https://doi.org/10.1117/12.753045

KEYWORDS: Surface finishing, Plasma, Ions, Magnetorheological finishing, Absorption, Fluorine, Polishing, Color centers, Coating, Excimer lasers

Read Abstract +

Proceedings Article | 14 September 2006 Paper

Paper

Nanostructure of GdF3 thin film evaluated by variable angle spectroscopic ellipsometry

Jue Wang, Robert Maier, Paul Dewa, Horst Schreiber, Robert Bellman, David Dawson Elli

Proceedings Volume 6321, 632107 (2006) https://doi.org/10.1117/12.677538

KEYWORDS: Data modeling, Atomic force microscopy, Refractive index, Thin films, Spectroscopic ellipsometry, Surface roughness, Deep ultraviolet, Contamination, Nanostructures, Optical properties

Read Abstract +

Proceedings Article | 28 August 2006 Paper

Paper

Wavefront control of UV narrow bandpass filters prepared by plasma ion-assisted deposition

Jue Wang, Robert Maier, Horst Schreiber

Proceedings Volume 6286, 628604 (2006) https://doi.org/10.1117/12.677539

KEYWORDS: Plasma, Annealing, Ultraviolet radiation, Wavefronts, Refractive index, Optical coatings, Ions, Tantalum, Bandpass filters, Oxides

Read Abstract +

Proceedings Article | 1 February 2006 Paper

Paper

Optical and hydrophobic nano-porous silica thin films with low refractive index

Lanfang Yao, Yongan Zhu, Dian Qu, Meifang Du, Jun Shen, Jue Wang

Proceedings Volume 6034, 60340V (2006) https://doi.org/10.1117/12.668115

KEYWORDS: Silica, Refractive index, Transmittance, Sol-gels, Thermography, Natural surfaces, Water, Thin films, Infrared radiation, Silicates

Read Abstract +

Proceedings Article | 20 August 2005 Paper

Paper

Correlation between mechanical stress and optical properties of SiO2/Ta2O5 multilayer UV narrow-bandpass filters deposited by plasma ion-assisted deposition

Jue Wang, Robert Maier

Proceedings Volume 5870, 58700E (2005) https://doi.org/10.1117/12.613285

KEYWORDS: Annealing, Tantalum, Ultraviolet radiation, Multilayers, Atomic force microscopy, Refractive index, Optical properties, Wavefront distortions, Data modeling, Optical filters

Read Abstract +

Proceedings Article | 8 December 2004 Paper

Paper

Preparation and properties of hydrophobic organic-inorganic silica hybrid films

Lanfang Yao, Guangming Wu, Zhaofeng Wu, Dian Qu, Guoqing Wang, Jun Shen, Jue Wang

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607289

KEYWORDS: Silica, Sol-gels, Natural surfaces, Refractive index, Transmittance, Infrared radiation, Silicates, Water, Infrared spectroscopy, Time multiplexed optical shutter

Read Abstract +

Proceedings Article | 8 December 2004 Paper

Paper

Preparation of low-density porous silica thin films by ambient pressure drying

Lanfang Yao, Jun Shen, Guangming Wu, Xingyuan Ni, Jue Wang, Bin Zhou

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607296

KEYWORDS: Thin films, Refractive index, Silica, Dielectrics, Sol-gels, Atomic force microscopy, Bioalcohols, Heat treatments, Infrared spectroscopy, Capillaries

Read Abstract +

Proceedings Article | 24 May 2004 Paper

Paper

Quasi-Brewster angle technique for evaluating the quality of optical surfaces

Jue Wang, Robert Maier

Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.533034

KEYWORDS: Surface finishing, Polishing, Magnetorheological finishing, Contamination, Atomic force microscopy, Deep ultraviolet, Surface roughness, Vacuum ultraviolet, Ultrasonics, Crystals

Read Abstract +

Proceedings Article | 4 November 2003 Paper

Paper

Surface characterization of optically polished CaF2 crystal by quasi-Brewster-angle technique

Jue Wang, Robert Maier, John Bruning

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.507180

KEYWORDS: Surface finishing, Contamination, Polishing, Refractive index, Radium, Surface roughness, Crystal optics, Crystals, Excimer lasers, Atomic force microscopy

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Preparation of zirconia thin films via sol-gel process from inorganic precursor

Jun Shen, Qinyuan Zhang, Jue Wang, Hongyan Lu, Tianhe Yang, Zhongsheng Deng, Bin Zhou, Lingyan Chen

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408484

KEYWORDS: Coating, Sol-gels, Zirconium dioxide, Refractive index, Thin films, Multilayers, Laser damage threshold, Particles, Silica, Reflectivity

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Preparation and properties of scratch-resistant nanoporous broadband AR silica films derived by a two-step catalytic sol-gel process

Guangming Wu, Jue Wang, Shen Jun, Tianhe Yang, Qinyuan Zhang, Bin Zhou, Zhongsheng Deng, Bin Fan, Dongping Zhou, Fengshan Zhang

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408386

KEYWORDS: Silica, Catalysis, Reflectivity, Sol-gels, Refractive index, Bioalcohols, Scanning electron microscopy, Glasses, Particles, Atomic force microscopy

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Optical and electrochemical properties of sol-gel-deposited tantalum pentoxide thin films

Qinyuan Zhang, Jun Shen, Guangming Wu, Bin Zhou, Junxia Lu, S. Attia, Zhongsheng Deng, Jue Wang

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408490

KEYWORDS: Thin films, Tantalum, Coating, Sol-gels, Electrodes, Refractive index, Bioalcohols, X-ray diffraction, Absorption, Crystals

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Application of sol-gel thin films on the transparent hologram

Zhongsheng Deng, Xingyuan Ni, Jue Wang, Jun Shen, Jiandong Wei, Lingyan Chen

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408373

KEYWORDS: Coating, Holograms, Thin films, Sol-gels, Holography, Scanning electron microscopy, Refractive index, Diffraction, Diamond, Titanium dioxide

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Influence of some physical parameters on sol-gel-derived TiO2 thin films

S. Attia, Jue Wang, Jun Shen, Guangming Wu, Qinyuan Zhang, Zhenquan Lai, Tianhe Yang

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408389

KEYWORDS: Refractive index, Thin films, Coating, Annealing, Sol-gels, Thin film coatings, Particles, Light scattering, Solid state physics, Titanium dioxide

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Preparation and optical property of island silver films embedded in silica

Zhenquan Lai, Bin Zhou, Jue Wang, S. Attia, Qinyuan Zhang, Li Zhao, Jiayu Wang, Xuejian Yan

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408477

KEYWORDS: Silver, Silica, Absorption, Optical properties, Nonlinear optics, Sputter deposition, Quantum dots, Glasses, Silicon, Semiconducting wafers

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Resorcinol-formaldehyde-derived carbon aerogel films

Jun Shen, Jue Wang, Yanzhi Guo, S. Attia, Bin Zhou

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408388

KEYWORDS: Carbon, Electrodes, Sol-gels, Scanning electron microscopy, Particles, Reflectivity, Infrared radiation, Microscopes, Nitrogen, Adsorption

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Paper

Nanocomposite multilayer optically variable coatings

Junxia Lu, Zhenquan Lai, Jiandong Wei, Huilin Zhang, Zhongsheng Deng, Qinyuan Zhang, Jue Wang

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408394

KEYWORDS: Optical coatings, Thin film coatings, Nanocomposites, Sol-gels, Thin films, Reflectivity, Positron emission tomography, Chromium, Multilayers, Nanotechnology

Read Abstract +

Proceedings Article | 20 February 1998 Paper

Paper

Preparation of TiO2 nanoparticle thin film with sol-gel process

Jun Shen, Zhinong Weng, Yulong Zhang, Zhongsheng Deng, Tianhe Yang, Jue Wang, Lingyan Chen

Proceedings Volume 3175, (1998) https://doi.org/10.1117/12.300677

KEYWORDS: Nanoparticles, Thin films, Sol-gels, Particles, Thin film coatings, Fabrication, Coating, Raw materials, Transmission electron microscopy, Titanium dioxide

Read Abstract +

Showing 5 of 44 publications

Conference Committee Involvement (10)

Advanced Optics for Imaging Applications: UV through LWIR IX

22 April 2024 | National Harbor, Maryland, United States

Advanced Optics for Imaging Applications: UV through LWIR VIII

1 May 2023 | Orlando, Florida, United States

Advanced Optics for Imaging Applications: UV through LWIR VII

3 April 2022 | Orlando, Florida, United States

Advanced Optics for Imaging Applications: UV through LWIR VI

12 April 2021 | Online Only, Florida, United States

Advanced Optics for Imaging Applications: UV through LWIR V

27 April 2020 | Online Only, California, United States

Showing 5 of 10 Conference Committees

SIGN IN TO:

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Advertisement

Advertisement