Yoshinori Ohsaki
at Canon Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 April 2008 Paper
Proceedings Volume 6924, 69241I (2008) https://doi.org/10.1117/12.771962
KEYWORDS: Polarization, Projection systems, Birefringence, Jones matrices, Distortion, Metrology, Laser induced plasma spectroscopy, Optical simulations, Wavefront aberrations, Image processing

Proceedings Article | 26 March 2007 Paper
Toshiyuki Yoshihara, Bunsuke Takeshita, Atsushi Shigenobu, Yasuo Hasegawa, Yoshinori Ohsaki, Kazuhiko Mishima, Seiya Miura
Proceedings Volume 6520, 652022 (2007) https://doi.org/10.1117/12.711375
KEYWORDS: Projection systems, Monochromatic aberrations, Wavefront aberrations, Control systems, Sensors, Aberration correction, Optics manufacturing, Metrology, Lithography, Optical properties

Proceedings Article | 15 March 2006 Paper
Y. Ohsaki, T. Mori, S. Koga, M. Ando, K. Yamamoto, T. Tezuka, Y. Shiode
Proceedings Volume 6154, 615424 (2006) https://doi.org/10.1117/12.657865
KEYWORDS: Projection systems, Wavefront aberrations, Fiber optic illuminators, Semiconducting wafers, Interferometers, Spatial coherence, Charge-coupled devices, Reticles, Light sources, Diffraction

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