Mr. Yi-Kun Xiong Profile

Yi-Kun Xiong

at Chongqing Institute of Metrology and Quality Inspection

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Publications (5)

Proceedings Article | 5 June 2024 Paper

Study on kinematic characteristics of SMA bionic flexible dexterous hand

Yang Xu, Yanxiang Fu, Yingqian Ni, Xiangrui Yang, Yikun Xiong, Wenbin Zhang

Proceedings Volume 13163, 131632Q (2024) https://doi.org/10.1117/12.3030338

KEYWORDS: Kinematics, Biomimetics, Shape memory alloys, Biological research, 3D modeling, Matrices, Motion models, Error analysis, Design, Thermal deformation

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Proceedings Article | 9 October 2021 Poster + Paper

Optimal inspection strategy planning for 3D geometric measurement based on laser scanning technique

Sen Zhou, Yikun Xiong, Jian Xu, Tong Liu

Proceedings Volume 11899, 118990W (2021) https://doi.org/10.1117/12.2600719

KEYWORDS: Laser scanners, Inspection, 3D metrology, 3D modeling, 3D scanning, Manufacturing, Clouds, Laser optics, Metrology, Measurement devices

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Proceedings Article | 10 October 2020 Poster + Presentation + Paper

An improved device for the 3D optical scanner calibration and related influence factors on calibrating result

Yi-Kun Xiong, Jian Xu, Sen Zhou, Long Chen, Jun Xiong

Proceedings Volume 11552, 1155213 (2020) https://doi.org/10.1117/12.2573168

KEYWORDS: Calibration, 3D scanning, Optical scanning, Optical calibration, 3D metrology, Optical spheres, Optics manufacturing, Inspection, 3D imaging standards, Clouds

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Proceedings Article | 10 October 2020 Poster + Paper

Performance evaluation experiments on scanning probe microscope

Sen Zhou, Yikun Xiong, Jin Zhou, Tong Liu

Proceedings Volume 11556, 115560L (2020) https://doi.org/10.1117/12.2572688

KEYWORDS: Scanning probe microscopes, 3D metrology, Semiconductor manufacturing, Space reconnaissance, 3D scanning, Solids, Image resolution, Calibration

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Proceedings Article | 6 May 2019 Paper

Development of a calibration device for the optical scanner

Long Chen, Yi-Kun Xiong, Sen Zhou, Ying-Qian Ni, Jun Xiong

Proceedings Volume 11069, 110692Z (2019) https://doi.org/10.1117/12.2524385

KEYWORDS: Optical scanning, Calibration, Spherical lenses, Optical calibration, Optical testing, Distance measurement, Metrology, Scanners, Error analysis

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