In this paper, the influence of the noise and acquisition device resolution of the system is researched on Homodyne Interferometric Angle Measurement Based on Ellipse Fitting. The research method combining data simulation and experimental verification is adopted. The influence of noise and acquisition resolution on the angular resolution is obtained by comparing the experimental and simulation results. The experimental verification results are consistent with the data simulation results. The system angle measurement resolution reaches 10-5 rad, and the system noise error is between 3%- 8%.
In the Taiji mission, since the transmission distance of the inter-satellite laser link reaches three million kilometers, the wavefront of its laser transmission will be distorted. Therefore, laser interferometric relative distance measurements can be significantly affected by laser-pointing jitter noise. We built a ground verification system based on the Michelson interferometer to verify critical technologies. At the same time, we analyzed the control characteristics of the system from the perspectives of frequency and time domains. In the end, we successfully built the system in the atmospheric environment of the laboratory and carried out related technical verifications. The experimental results show that in the case of 4µrad/√ Hz@10mHz disturbance, the system can suppress the laser pointing jitter noise to 31.2nrad/√ Hz@10mHz (inner ring data) and 385.7nrad/√ Hz@10mHz (outer ring data), and the effect has reached below the noise floor. The experiment promotes the development of pointing system technology based on the Michelson interferometer and provides relevant technical verification for the follow-up Taiji mission.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.