Weiwei Li
at Guilin Univ. of Electronic Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 February 2020 Paper
Proceedings Volume 11431, 1143107 (2020) https://doi.org/10.1117/12.2539329
KEYWORDS: Image quality, Super resolution, Feature extraction, Magnetic resonance imaging, Neural networks, Lawrencium, Convolution, Image resolution, Image enhancement, Image processing

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