Wanze Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 November 2023 Paper
Wanze Li, Rui Zhang, Chang'an Hu, Dekun Peng
Proceedings Volume 12815, 128150U (2023) https://doi.org/10.1117/12.3010669
KEYWORDS: Interferometers, Measurement devices, Standards development, Temperature metrology, Equipment, Distance measurement, Metrology, Data acquisition, Reflectors, Precision measurement

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