Dr. Volker Scheuer Profile

Dr. Volker Scheuer

CEO at NANEO Precision IBS Coatings GmbH

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Publications (9)

Proceedings Article | 16 March 2023 Presentation + Paper

High quality optical Indium Tin Oxide (ITO) layers deposited by ion beam sputtering (IBS)

Konstantina Kostourou, Volker Scheuer, Daniel Kopf

Proceedings Volume 12422, 124220K (2023) https://doi.org/10.1117/12.2648888

KEYWORDS: Resistance, Ions, Sputter deposition, Vacuum chambers, Ion beams, Tin, Deposition processes, Surface roughness, Oxides, Optical properties

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Proceedings Article | 4 June 1999 Paper

Progress on all-solid state passively modelocked picosecond and femtosecond lasers

Ruediger Paschotta, Clemens Hoenninger, Juerg Aus der Au, Gabriel Spuehler, Dirk Sutter, Nicolai Matuschek, Frieder Loesel, Francois Morier-Genoud, Ursula Keller, Michael Moser, Rainer Hoevel, Volker Scheuer, G. Angelow, Theo Tschudi, Michael Dymott, Daniel Kopf, Jens Meyer, Kurt Weingarten, Jeffrey Kmetec, Jason Alexander, Glen Truong

Proceedings Volume 3616, (1999) https://doi.org/10.1117/12.351820

KEYWORDS: Mode locking, Femtosecond phenomena, Mirrors, Picosecond phenomena, Diodes, Semiconductor lasers, Pulsed laser operation, Semiconductors, High power lasers, Solitons

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Proceedings Article | 28 April 1999 Paper

Integration of InGaAs/InP PIN diodes with Fabry-Perot filters for wavelength-selective receivers

Rolf Riemenschneider, Joachim Peerlings, V. Naveen Kumar, Martin Strassner, Joachim Pfeiffer, Kabula Mutamba, S. Herbst, Juergen Daleiden-, Volker Scheuer, Hans Hartnagel, Peter Meissner

Proceedings Volume 3666, (1999) https://doi.org/10.1117/12.347951

KEYWORDS: Receivers, Mirrors, PIN photodiodes, Diodes, Sensors, Fabry–Perot interferometers, Optical filters, Polishing, GRIN lenses, Actuators

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Proceedings Article | 1 October 1997 Paper

Effects of thermal annealing on ion-beam-sputtered SiO2 and TiO2 optical thin films

Markus Tilsch, Volker Scheuer, Theo Tschudi

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.279104

KEYWORDS: Annealing, Absorption, Refractive index, Crystals, Oxygen, Interfaces, Diffusion, Ion beams, Light scattering, Silica

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Proceedings Article | 19 August 1996 Paper

3D simulation of thin film growth conditions at ion beam sputter deposition and comparison to experimental investigations

Markus Tilsch, Volker Scheuer, Jochen Biersack, Theo Tschudi

Proceedings Volume 2775, (1996) https://doi.org/10.1117/12.246794

KEYWORDS: Oxygen, Ions, Particles, Sputter deposition, Absorption, Ion beams, Optical simulations, Chemical species, 3D acquisition, Silicon

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Proceedings Article | 4 November 1994 Paper

Reduction of absorption losses in ion beam sputter deposition of optical coatings for the visible and near infrared

Volker Scheuer, Markus Tilsch, Theo Tschudi

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192118

KEYWORDS: Absorption, Sputter deposition, Oxygen, Particles, Argon, Titanium, Xenon, Ion beams, Ions, Metals

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Proceedings Article | 4 November 1994 Paper

Design of an integrated scatter instrument for measuring scatter losses of superpolished optical surfaces, application to surface characterization of transparent fused quartz substrates

Oliver Kienzle, Volker Scheuer, Josef Staub, Theo Tschudi

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192058

KEYWORDS: Scattering, Interfaces, Light scattering, Optical spheres, Scatter measurement, Fused quartz, Surface finishing, Surface roughness, Laser scattering, Rayleigh scattering

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Proceedings Article | 4 November 1994 Paper

Direct optical monitoring instrument with a double detection system for the control of multilayer systems from the visible to the near infrared

Markus Tilsch, Volker Scheuer, Josef Staub, Theo Tschudi

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192114

KEYWORDS: Transmittance, Sensors, Control systems, Mirrors, Photodiodes, Spectroscopy, Geometrical optics, Multilayers, Monochromators, Beam splitters

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Proceedings Article | 4 November 1994 Paper

Low-power laser calorimetry with high resolution

Hans Becker, Volker Scheuer, Theo Tschudi

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192102

KEYWORDS: Absorption, Calorimetry, Temperature metrology, Convection, Argon ion lasers, Silica, Numerical simulations, Laser development, Coating, Carbon dioxide lasers

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Showing 5 of 9 publications

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