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The developed computer model and the results of the study allow us to estimate the probabilistic characteristics of detection of a complex structured mark on a random gradient background, and estimate the error of spatial coordinates. The results of the study make it possible to improve the accuracy of measuring the coordinates of the object. Based on the research recommendations are given on the choice of parameters of the optimal mark structure for use in opticalelectronic systems for monitoring the spatial position of large-sized structures.
The results of the research will allow to develop the theory of formation of control systems of the displacement with high accuracy and unattainable for the existing analogue ergonomic and weight characteristics combined with a comparable or lower cost. These advantages will allow you to be successful competition, and eventually to supplant the existing system, which had no fundamental changes in the last 20 years and, therefore, retained all the drawbacks: large size and weight, high power consumption, the dependence on magnetic fields
Algorithm for recognition and measurement position of pitches on invar scale with submicron accuracy
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