Uttam Nandi
at Technische Univ Darmstadt
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12134, 1213408 (2022) https://doi.org/10.1117/12.2626219
KEYWORDS: Terahertz radiation, Semiconducting wafers, Semiconductor lasers, Principal component analysis, Silicon, Refractive index, Receivers, Photonics, Metrology, Fabry–Perot interferometers

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