Prof. Tilo Pfeifer Profile

Prof. Tilo Pfeifer

at RWTH Aachen Univ

SPIE Involvement:

Author

Publications (25)

Proceedings Article | 7 March 2006 Paper

Interferometer calibration: an approach with the virtual interferometer

Alexander Bai, Frank Bitte, Horst Mischo, Tilo Pfeifer

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498405

KEYWORDS: Interferometers, Calibration, Interferometry, Error analysis, Virtual reality, Optical components, Standards development, Optical spheres, Metrology, Phase shifts

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Proceedings Article | 7 March 2006 Paper

Model-based optimization of interferometers for testing aspherical surfaces

Horst Mischo, Tilo Pfeifer, Frank Bitte

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498406

KEYWORDS: Interferometers, Interferometry, Mirrors, Optimization (mathematics), Optical spheres, Error analysis, Phase shifting, Model-based design, Phase measurement, Wavefronts

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Proceedings Article | 1 July 2005 Paper

Advanced optical metrology aimed at part inspection and reverse engineering for Mems and Nems

Tilo Pfeifer, Robert Schmitt, Ubaldo Aleriano

Proceedings Volume 5836, (2005) https://doi.org/10.1117/12.608980

KEYWORDS: Microscopes, Confocal microscopy, Microelectromechanical systems, Nanoelectromechanical systems, Objectives, Atomic force microscopy, Beam splitters, Image processing, Metrology, Computer aided design

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Proceedings Article | 14 February 2005 Paper

3D image acquisition by fiber-based fringe projection

Tilo Pfeifer, Sascha Driessen

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611570

KEYWORDS: Image processing, Fringe analysis, Projection systems, Cameras, 3D acquisition, 3D image processing, Sensors, Image transmission, CCD cameras, Computer aided design

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Proceedings Article | 10 September 2004 Paper

Visual robot control for close-range inspections

Frank Monning, Tilo Pfeifer

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545603

KEYWORDS: Cameras, Calibration, Visualization, Imaging systems, Metrology, Inspection, Computer programming, Robotic systems, Control systems, Optical inspection

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Proceedings Article | 10 September 2004 Paper

User-friendly optical metrology in production engineering

Stephan Bichmann, Ulf Glaser, Tilo Pfeifer

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.543605

KEYWORDS: Inspection, Sensors, Computer aided design, Optical metrology, Metrology, Data acquisition, Standards development, Optical sensors, Laser welding, Product engineering

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Proceedings Article | 26 February 2004 Paper

Manufacturing of optical molds using an integrated simulation and measurement interface

Manfred Weck, Markus Winterschladen, Tilo Pfeifer, Dirk Doerner, Ekkard Brinksmeier, Lutz Autschbach, Oltmann Riemer

Proceedings Volume 5252, (2004) https://doi.org/10.1117/12.513564

KEYWORDS: Glasses, Optics manufacturing, Interfaces, Diamond machining, Manufacturing, Finite element methods, Interferometers, Surface finishing, Diamond, Optical components

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Proceedings Article | 14 October 2003 Paper

New method for confocal microscopy and its endoscopic application

Ingo Krohne, Tilo Pfeifer, Frank Bitte, Michael Zacher, Richard Meier

Proceedings Volume 5143, (2003) https://doi.org/10.1117/12.500763

KEYWORDS: Confocal microscopy, Digital micromirror devices, Microscopes, Endoscopy, Charge-coupled devices, Micromirrors, Objectives, Biomedical optics, Reflection, Mirrors

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Proceedings Article | 30 May 2003 Paper

New integrated approach for repairing and redesigning heavy forming tools

Stephan Bichmann, Michael Zacher, Ulf Glaser, Tilo Pfeifer

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.499162

KEYWORDS: Computer aided design, Sensors, Laser welding, Metals, Data acquisition, Projection systems, Optical metrology, Interfaces, Spindles, Clouds

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Proceedings Article | 30 May 2003 Paper

ProSens: integrated production control by automated inspection planning and efficient multisensor metrology

Ulf Glaser, Zhichao Li, Stephan Bichmann, Tilo Pfeifer

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.499918

KEYWORDS: Inspection, Databases, Metrology, Manufacturing, Computer aided design, Control systems, Tolerancing, Sensors, Data acquisition, Crystals

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Proceedings Article | 25 March 2003 Paper

Gripping tool for MEMS assembly with an absolute distance measurement sensor using a fiber optic WL interferometer with high measuring frequency

Tilo Pfeifer, Ubaldo Aleriano, Frank Depiereux

Proceedings Volume 4945, (2003) https://doi.org/10.1117/12.468417

KEYWORDS: Fiber optics sensors, Sensors, Interferometers, Manufacturing, Microelectromechanical systems, Distance measurement, Fiber optics tests, Fiber optics, Photodetectors, Metrology

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Proceedings Article | 18 October 2002 Paper

Robust texture segmentation algorithm based on the Fourier spectrum analysis

Tilo Pfeifer, Dominic Sack, Alexandre Orth

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467628

KEYWORDS: Image segmentation, Image processing algorithms and systems, Algorithm development, Neural networks, Neurons, Image processing, Fourier transforms, Statistical analysis, Image classification, Error analysis

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Proceedings Article | 29 July 2002 Paper

Fiber optic interferometer for absolute distance measurements with high measuring frequency

Christof Bosbach, Frank Depiereux, T. Pfeifer, B. Michelt

Proceedings Volume 4900, (2002) https://doi.org/10.1117/12.484589

KEYWORDS: Sensors, Interferometers, Mirrors, Signal detection, Receivers, Optical fibers, Light sources, Reflectors, GRIN lenses, Distance measurement

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Proceedings Article | 8 March 2002 Paper

Object digitalization using a scanning fringe projection system

Michael Zacher, Ingo Krohne, Ulf Glaser, T. Pfeifer

Proceedings Volume 4661, (2002) https://doi.org/10.1117/12.460173

KEYWORDS: Sensors, Projection systems, Computer aided design, 3D metrology, Clouds, Reverse engineering, Optical spheres, Metals, Data acquisition, 3D acquisition

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Proceedings Article | 23 October 2001 Paper

New measurement system for microscopic formtesting of microstructures by means of multiple-wavelength interferometry

Karsten Schneefuss, Tilo Pfeifer

Proceedings Volume 4400, (2001) https://doi.org/10.1117/12.445597

KEYWORDS: Interferometry, Prisms, Spherical lenses, Reflection, Confocal microscopy, Optical sensors, Wavefronts, Laser optics, Phase shifts, Inspection

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Proceedings Article | 11 September 2001 Paper

Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge technique

Juliano de Lemos, Horst Mischo, Tilo Pfeifer

Proceedings Volume 4420, (2001) https://doi.org/10.1117/12.439202

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Proceedings Article | 24 October 2000 Paper

MicroScan: a DMD-based optical surface profiler

Frank Bitte, Gerd Dussler, Tilo Pfeifer, Gottfried Frankowski

Proceedings Volume 4093, (2000) https://doi.org/10.1117/12.405219

KEYWORDS: Digital micromirror devices, Confocal microscopy, Microscopes, Cameras, Micromirrors, Charge-coupled devices, Mirrors, Optical metrology, Profilometers, Metrology

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Proceedings Article | 21 September 1999 Paper

Active vision approach for optimizing illumination in critical surface inspection by machine vision

Tilo Pfeifer, Lorenz Wiegers

Proceedings Volume 3824, (1999) https://doi.org/10.1117/12.364248

KEYWORDS: Inspection, Surface finishing, Machine vision, Reflection, Imaging systems, Metals, Image filtering, Polishing, Image analysis, Specular reflections

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Proceedings Article | 15 September 1999 Paper

Inspection of microsystems with a laser scanning microscope

Gerd Dussler, B. Broecher, Tilo Pfeifer

Proceedings Volume 3825, (1999) https://doi.org/10.1117/12.364295

KEYWORDS: Microscopes, Confocal microscopy, Microsystems, Inspection, Visualization, Process control, Control systems, Product engineering, Visual analytics, Defect detection

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Proceedings Article | 9 September 1999 Paper

Strain/stress measurements using combined ESPI contouring and deformation measurements

Tilo Pfeifer, Horst Mischo, J. Lemos, Ronny Wegner

Proceedings Volume 3823, (1999) https://doi.org/10.1117/12.360997

KEYWORDS: Sensors, Optical sensors, Light sources, Resistance, Tunable lasers, Optical testing, Carbon, Surface finishing, Interferometry, Metrology

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Proceedings Article | 9 September 1999 Paper

Alternative methods for wavelength determination: interference filters and double photodiodes

Frank Bitte, Tilo Pfeifer

Proceedings Volume 3823, (1999) https://doi.org/10.1117/12.360984

KEYWORDS: Photodiodes, Interference filters, Transmittance, Calibration, Tunable lasers, Diodes, Polarization, Refraction, Reflectivity, Interferometry

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Proceedings Article | 13 August 1999 Paper

Spectral characteristics of filters and semiconductor devices for wavelength metrology

Frank Bitte, Tilo Pfeifer

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357741

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Proceedings Article | 29 December 1998 Paper

Strain/stress measurements using electronic speckle pattern interferometry

Tilo Pfeifer, Horst Mischo, Andreas Ettemeyer, Zhiguo Wang, Ronny Wegner

Proceedings Volume 3520, (1998) https://doi.org/10.1117/12.334340

KEYWORDS: Sensors, Interferometry, Light sources, Speckle pattern, 3D metrology, Metals, Metrology, Prototyping, Light, Materials analysis

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Proceedings Article | 19 August 1996 Paper

Aspheric form testing using multiple-wavelength approaches in combination with subNyquist techniques

Tilo Pfeifer, Horst Mischo, Jens Evertz, Rainer Tutsch

Proceedings Volume 2775, (1996) https://doi.org/10.1117/12.246769

KEYWORDS: Mirrors, Interferometry, Aspheric lenses, Wavefronts, Manufacturing, CCD cameras, Signal to noise ratio, Aspheric optics, Fringe analysis, Chromatic aberrations

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Proceedings Article | 1 January 1993 Paper

Testing aspherics without rotational symmetry using a Fizeau interferometer with computer-generated holograms

Tilo Pfeifer, Jens Evertz, Rainer Tutsch, Hendrik Rothe

Proceedings Volume 1781, (1993) https://doi.org/10.1117/12.140972

KEYWORDS: Computer generated holography, Mirrors, Holograms, Aspheric lenses, Optical testing, Wavefronts, Diffraction, Interferometers, Fizeau interferometers, Optics manufacturing

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Showing 5 of 25 publications

Conference Committee Involvement (3)

Optical Measurement Systems for Industrial Inspection IV

13 June 2005 | Munich, Germany

Optical Metrology in Production Engineering

27 April 2004 | Strasbourg, France

Optical Measurement Systems for Industrial Inspection III

23 June 2003 | Munich, Germany

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