Dr. Thorsten Dziomba Profile

Dr. Thorsten Dziomba

at Physikalisch-Technische Bundesanstalt

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 22 July 2019 Paper

Method for non-invasive hemoglobin oxygen saturation measurement using broadband light source and color filters

Wenze Wu, Finn-Niclas Stapelfeldt, Thomas Weimann, Peter Hinze, Thorsten Dziomba, Bernd Bodermann, Stefanie Kroker, Hutomo Suryo Wasisto, Andreas Waag

Proceedings Volume 11076, 110761S (2019) https://doi.org/10.1117/12.2527202

KEYWORDS: Optical filters, Light sources, Image sensors, Sensors, Light emitting diodes, Oxygen, Oximetry, Tissue optics, Signal detection, Signal processing

Read Abstract +

Proceedings Article | 20 October 2005 Paper

Standardization in dimensional nanometrology: development of a calibration guideline for Scanning Probe Microscopy

Thorsten Dziomba, Ludger Koenders, Günter Wilkening

Proceedings Volume 5965, 59650C (2005) https://doi.org/10.1117/12.626018

KEYWORDS: Scanning probe microscopy, Calibration, Standards development, Metrology, Atomic force microscopy, Scanners, Scanning electron microscopy, Electronics, Nanotechnology, Control systems

Read Abstract +

Proceedings Article | 24 May 2004 Paper

Characterization of a 100-nm 1D pitch standard by metrological SEM and SFM

Wolfgang Haessler-Grohne, Thorsten Dziomba, Carl Frase, Harald Bosse, Jerry Prochazka

Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.536285

KEYWORDS: Scanning electron microscopy, Atomic force microscopy, Calibration, Line edge roughness, Metrology, Interferometers, Microscopes, Phase shifts, Very large scale integration, Electron microscopes

Read Abstract +

Proceedings Article | 30 April 1998 Paper

Near-field optical tools to read, write, and copy information at the 100- to 10-nm scale

U. Fischer, A. Naber, T. Dziomba, J. Koglin, W. Goehde, O. Panzer, Harald Fuchs

Proceedings Volume 3272, (1998) https://doi.org/10.1117/12.307133

KEYWORDS: Near field, Near field scanning optical microscopy, Molecules, Near field optics, Microscopy, Energy transfer, Metals, Lithography, Photomasks, Diffraction

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years