Dr. Thomas Eisenhammer
Head of R&D at Optics Balzers AG
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 19 October 2016 Presentation + Paper
Jan Broßmann, Thorsten Best, Thomas Bauer, Stefan Jakobs, Thomas Eisenhammer
Proceedings Volume 10000, 100001E (2016) https://doi.org/10.1117/12.2241069
KEYWORDS: Optical filters, Optical coatings, Multispectral imaging, Interference filters, Sputter deposition, Bandpass filters, Thin films, Thin film coatings, Semiconducting wafers, Optical lithography

Proceedings Article | 7 October 2014 Paper
Proceedings Volume 9241, 92411K (2014) https://doi.org/10.1117/12.2069596
KEYWORDS: Optical filters, Optical coatings, Sensors, Optics manufacturing, Remote sensing, Optical lithography, Bandpass filters, Linear filtering, Plasma, Photoresist materials

Proceedings Article | 22 June 2006 Paper
Bernd Heinz, Thomas Eisenhammer, Martin Dubs, Cem Yavaser, Thomas Pfaff
Proceedings Volume 6282, 62820G (2006) https://doi.org/10.1117/12.685201
KEYWORDS: Coating, Ultraviolet radiation, Thin film coatings, Humidity, Optical storage, Silicon, Manufacturing, Standards development, Process control, Digital video discs

Proceedings Article | 9 September 2004 Paper
Masahiko Tsukuda, Eiichi Ito, Morio Tomiyama, Shinya Abe, Eiji Ohno, Stephane David, Martin Dubs, Chris Bayliss, Colin Dix, Nick Ogilvie, Simon Proffitt, David Scott-Maxwell, Bernard Fantin, Thomas Eisenhammer
Proceedings Volume 5380, (2004) https://doi.org/10.1117/12.567973
KEYWORDS: Electron beams, Prototyping, Dynamical systems, Scanning electron microscopy, Electromagnetism, Chemically amplified resists, Reflectivity, Diffusion, Control systems, Objectives

Proceedings Article | 9 September 1994 Paper
Thomas Eisenhammer, F. Muggenthaler
Proceedings Volume 2255, (1994) https://doi.org/10.1117/12.185393
KEYWORDS: Silver, Reflectivity, Dielectrics, Nitrogen, Sputter deposition, Thin films, Silicon, Aluminum, Metals, Glasses

Showing 5 of 9 publications
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