Takahiro Fukai
at Tokyo Electron Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 6 December 2004 Paper
Peter Tichy, Takahiro Fukai, Shigenori Kamei, Hiroshi Asai, Tatsuhito Kotoda, Kazuhiro Takeshita, Tetsushi Miyamoto, Yoshiki Okamoto, Hideo Funakoshi, Shinji Koga, Shigemi Oono, Rusty Cantrell, Axel Feicke, Wolfram Porsche, Martin Tschinkl, Gaston Lee
Proceedings Volume 5567, (2004) https://doi.org/10.1117/12.568820
KEYWORDS: Photomasks, Semiconducting wafers, Photoresist developing, Manufacturing, Critical dimension metrology, Reticles, Control systems, Diffusion, Photoresist processing, Wafer manufacturing

Proceedings Article | 6 December 2004 Paper
Rusty Cantrell, Martin Tschinkl, Axel Feicke, Wolfram Porsche, Gaston Lee, Tatsuhito Kotoda, Peter Tichy, Takahiro Fukai, Shigenori Kamei, Hiroshi Asai
Proceedings Volume 5567, (2004) https://doi.org/10.1117/12.568393
KEYWORDS: Photomasks, Semiconducting wafers, Particles, Deep ultraviolet, Standards development, Lithography, Manufacturing, Photoresist processing, Control systems, Diffractive optical elements

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