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Suman Tewary
Quick Hire Scientist (Trainee) at CSIR - Central Scientific Instruments Organisation
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Publications (1)
SPIE Journal Paper | 27 June 2019
Optical characterization of silicon dioxide thin films prepared by ion-assisted electron beam deposition
Mukesh Kumar, Suman Tewary, Neelam Kumari, Amit Lochan Sharma, Vinod Karar
OE, Vol. 58, Issue 06, 065104, (June 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.6.065104
KEYWORDS: Thin films, Refractive index, Coating, Silica, Image processing, Sapphire, Image quality, Data modeling, Thin film coatings, Statistical analysis
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