Dr. Stefan Patzelt Profile

Dr. Stefan Patzelt

at Univ Bremen

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Author

Publications (7)

Proceedings Article | 26 June 2017 Paper

Uncertainty of scattered light roughness measurements based on speckle correlation methods

Stefan Patzelt, Dirk Stöbener, Gerald Ströbel, Andreas Fischer

Proceedings Volume 10329, 103291P (2017) https://doi.org/10.1117/12.2269171

KEYWORDS: Laser scattering, Statistical analysis, Quantization, Speckle, Light scattering, Optical testing, Cameras, Process modeling, Sensors, Measurement devices, Speckle pattern, Scatter measurement, Metrology

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Proceedings Article | 20 April 2006 Paper

Simulation of light scattering for surfaces with statistically distributed subwavelength cavities

A. Tausendfreund, S. Patzelt, D. Mader, S. Simon, G. Goch

Proceedings Volume 6195, 619511 (2006) https://doi.org/10.1117/12.661724

KEYWORDS: Light scattering, Radium, Speckle, Scattering, Speckle pattern, Near field, Laser scattering, Near field optics, Finite element methods, Computer simulations

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Proceedings Article | 20 April 2006 Paper

Simulation of light scattering from surfaces containing spherical and elliptical nanoparticles

A. Tausendfreund, D. Mader, S. Simon, S. Patzelt, G. Goch

Proceedings Volume 6195, 619514 (2006) https://doi.org/10.1117/12.663071

KEYWORDS: Optical spheres, Spherical lenses, Light scattering, Particles, Nanoparticles, Scattering, Near field optics, Mie scattering, Computer simulations, Diffraction

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Proceedings Article | 25 October 2004 Paper

Fast direct optical position measurement applied to parallel kinematics machines

Kristian Schroeder, Stefan Patzelt, Gert Goch

Proceedings Volume 5602, (2004) https://doi.org/10.1117/12.580300

KEYWORDS: Kinematics, Sensors, CCD cameras, Optical testing, Calibration, Mirrors, Matrices, Measurement devices, Charge-coupled devices, CCD image sensors

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Proceedings Article | 23 October 2001 Paper

Calibration techniques for fringe projectors

Joerg Peters, Stefan Patzelt, Frank Horn, Gert Goch

Proceedings Volume 4398, (2001) https://doi.org/10.1117/12.445553

KEYWORDS: Calibration, Optical spheres, Projection systems, Interferometry, Distance measurement, CCD cameras, Fringe analysis, Mirrors, Interferometers, Measurement devices

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Proceedings Article | 26 September 2000 Paper

In-process characterization of surface topography changes during nitration

Andreas Ciossek, Peter Lehmann, Stefan Patzelt, Gert Goch

Proceedings Volume 4100, (2000) https://doi.org/10.1117/12.401658

KEYWORDS: Speckle, Speckle pattern, Surface roughness, Nitrogen, Surface finishing, CCD cameras, Light scattering, Algorithm development, Process control, Scattering

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Proceedings Article | 30 October 1998 Paper

Parametric optical surface roughness measurement by means of polychromatic speckle autocorrelation

Stefan Patzelt, Andreas Ciossek, Peter Lehmann, Armin Schoene

Proceedings Volume 3426, (1998) https://doi.org/10.1117/12.328446

KEYWORDS: Speckle, Speckle pattern, Surface roughness, Light scattering, Semiconductor lasers, Optical testing, Correlation function, Beam splitters, CCD cameras, Superposition

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Showing 5 of 7 publications

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