Sputtering of Cu/Ti layers was performed by Ar+ions. Analysis of the atomic and molecular composition of the sputtered
plume was performed by means of Ultra-short Laser Neutral Mass Spectrometry (US-LSNMS) and Secondary Ion Mass
Spectrometry (SIMS). Several ionic masses were observed and systematically studied with respect to the exposure time,
laser fluence and target composition. The obtained data for complex layers indicate generally a good agreement between
SNMS and SIMS. SIMS is more sensitive for many elements however the mass interferences can limit the analytical
applicability. US-LSNMS mass spectra of Cu(Ti) sample have been acquired for different exposure times. In order to
determine the effect of different laser ionization energies over the mass distribution of the elements, mass spectra of
Cu(Ti) multilayers at several laser ionization energies were acquired. The elements interdiffusion was analyzed also by
US-LSNMS, demonstrating the sensitivity, the limits and the future potential of the SNMS method for material
characterization.
We have developed a low cost apparatus for open- and closed-aperture Z-scan measurements of multi-photon absorption
(MPA) cross-sections of solid and liquid samples. The experimental setup uses simple diodes for light detection. The
signals are recorded with a low-cost two-channel PC-scope. We have developed a LabView based software, which
analyzes single laser pulses and allows averaging over several shots. First measurements on a CR-39 polymer
demonstrated the functioning of the method. Furthermore, we have shown that for 25fsec ultra short pulses three-photon
absorption (ThPa) must be considered in addition to two-photon absorption (TPA). The appropriate nonlinear absorption
(TPA-, ThPA-) coefficients and the nonlinear refractive index can be obtained via a best fit of the data to theoretical
curves, which have been derived and adapted for ThPA from formulas for TPA accessible in the literature.
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