Dr. Seng-Fatt Liew
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 15 March 2018 Presentation
A. Douglas Stone, Chiawei Hsu, Seng-Fatt Liew, Arthur Goetschy, Hui Cao
Proceedings Volume 10502, 105020T (2018) https://doi.org/10.1117/12.2293693
KEYWORDS: Light scattering, Scattering, Spatial light modulators, Wavefronts, Speckle, Adaptive optics, Phototherapy, Cryptography, Speckle pattern, Scattering media

Proceedings Article | 24 April 2017 Presentation
Chia Wei Hsu, Seng Fatt Liew, Arthur Goetschy, Hui Cao, A. Douglas Stone
Proceedings Volume 10073, 100730P (2017) https://doi.org/10.1117/12.2250352
KEYWORDS: Light scattering, Wavefronts, Diffusion, Scattering, Systems modeling, Wave propagation, Speckle pattern, Optical communications, Medium wave, Zinc oxide

Proceedings Article | 21 April 2017 Presentation
Hui Cao, Seng Fatt Liew, Sebastian Knitter, Sascha Weiler, Jesus Monjardin-Lopez, Mark Ramme, Brandon Redding, Michael Choma
Proceedings Volume 10088, 1008807 (2017) https://doi.org/10.1117/12.2251503
KEYWORDS: Laser development, Spatial coherence, Visible radiation, Speckle, Second-harmonic generation, Imaging spectroscopy, Laser applications, Infrared imaging, Infrared lasers, Luminescence

Proceedings Article | 4 March 2016 Paper
Brett Hokr, Alexander Cerjan, Jonathan Thompson, Luqi Yuan, Seng Fatt Liew, Joel Bixler, Gary Noojin, Robert Thomas, Hui Cao, A. Douglas Stone, Benjamin Rockwell, Marlan Scully, Vladislav Yakovlev
Proceedings Volume 9731, 973110 (2016) https://doi.org/10.1117/12.2212911
KEYWORDS: Raman spectroscopy, Diffusion, Absorption, Raman scattering, Monte Carlo methods, Photons, Picosecond phenomena, Statistical modeling, Nonlinear dynamics, Nonlinear optics, Speckle, Laser applications, Charge-coupled devices, Wave propagation, Laser scattering

Proceedings Article | 21 May 2014 Paper
Proceedings Volume 9101, 910105 (2014) https://doi.org/10.1117/12.2050021
KEYWORDS: Spectroscopy, Scattering, Light scattering, Waveguides, Photonic crystals, Calibration, Sensors, Speckle pattern, Silicon, Spectral calibration

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