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Sébastien Delcourt
at Univ des Lille
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Publications (1)
Proceedings Article | 25 May 2004 Paper
Thermal de-embedding procedure for cryogenic on wafer high frequency noise measurement
Sébastien Delcourt, Gilles Dambrine, Nourr Eddine Bourzgui, Francois Danneville, Christophe Laporte, Jean-Philippe Fraysse, Michel Maignan
Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.545997
KEYWORDS: Temperature metrology, Cryogenics, Transistors, Data modeling, Advanced distributed simulations, Modeling, Field effect transistors, Semiconducting wafers, 3D modeling, Thermal modeling
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