Seokyoon Jeong
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12495, 1249518 (2023) https://doi.org/10.1117/12.2658322
KEYWORDS: Data modeling, Process modeling, Machine learning, Optical proximity correction, Statistical modeling, Calibration, Instrument modeling, Metrology, Design and modelling, Resolution enhancement technologies

Proceedings Article | 4 April 2011 Paper
Jaeyoon Jeong, Seokyun Jeong, Changhoon Ahn, Yongsun Jang, Sukjoo Lee, Thomas Cecil, Donghwan Son, Tatung Chow, David Kim
Proceedings Volume 7974, 797409 (2011) https://doi.org/10.1117/12.879393
KEYWORDS: Photomasks, Lithography, Optical proximity correction, Source mask optimization, Photovoltaics, Optical lithography, Optimization (mathematics), Detection and tracking algorithms, Electroluminescence, Semiconducting wafers

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