Dr. Richard L. Rawe Profile

Dr. Richard L. Rawe

at L3Harris Technologies Inc

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 17 May 2006 Paper

High quantum efficiency C-QWIP FPA based IR cameras

John Devitt, David Forrai, Darrel Endres, Richard Rawe, Bob Fischer, K. Choi, V. Swaminathan

Proceedings Volume 6206, 62060C (2006) https://doi.org/10.1117/12.664714

KEYWORDS: Quantum efficiency, Sensors, Staring arrays, Quantum well infrared photodetectors, Cameras, Infrared cameras, Polarization, Semiconducting wafers, Imaging systems, Electronics

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Proceedings Article | 31 May 2005 Paper

Novel high fill-factor, small pitch, reticulated InSb IR FPA design

R. Rawe, C. Martin, M. Garter, D. Endres, B. Fischer, M. Davis, J. Devitt, M. Greiner

Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.603604

KEYWORDS: Staring arrays, Micro optics, Sensors, Silicon, Etching, Readout integrated circuits, Plasma etching, Tolerancing, Electronics, Wet etching

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Proceedings Article | 21 October 2004 Paper

Advanced FPA technology development at CMC Electronics

Mike Davis, John Devitt, Mark Greiner, Rich Rawe, A. Timlin, David Wade

Proceedings Volume 5563, (2004) https://doi.org/10.1117/12.565665

KEYWORDS: Staring arrays, Electronics, Reliability, Sensors, Indium, Black bodies, Yield improvement, Semiconducting wafers, Diffusion, Data modeling

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Proceedings Article | 30 August 2004 Paper

Advanced large-format InSb IR FPA maturation at CMC Electronics

Rich Rawe, A. Timlin, Mike Davis, John Devitt, Mark Greiner

Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.542699

KEYWORDS: Staring arrays, Yield improvement, Electronics, Black bodies, Sensors, Reliability, Diffusion, Data modeling, Readout integrated circuits, Semiconducting wafers

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Proceedings Article | 10 October 2003 Paper

State of the art in large-format IR FPA development at CMC Electronics, Cincinnati

Mark Greiner, Mike Davis, John Devitt, Rich Rawe, David Wade, Jeff Voelker

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.487644

KEYWORDS: Staring arrays, Semiconducting wafers, Electronics, Silicon, Sensors, Readout integrated circuits, Visualization, Optical filters, Indium, Yield improvement

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