The fine alignment of X-ray nano-focusing optics, such as Kirkpatrick-Baez (KB) mirrors, depends strongly on the ability to diagnose the X-ray beam at the focus position. Despite conventional diagnostics techniques (e.g. knife-edge) allowing the measurement of the beam profile with sub-micrometer resolution, they may yield poor accuracy for beams with sizes under 100 nm. With nanometer-resolution phase-recovering techniques like ptychography, information about optical aberrations can be obtained experimentally in the complex-valued wavefront. In this work, we use wave-propagation simulations with Synchrotron Radiation Workshop (SRW) to model the CARNAÚBA beamline at Sirius. The beam phase at the KB mirrors exit pupil is decomposed in terms of Zernike rectangular polynomials. The relevant degrees of freedom (DOF) of the mirrors are scanned, allowing the correlation of the Zernike coefficients with the beam profile at focus. Therefore, the aberrations are classified and quantified for each mirror’s DOF, and alignment tolerances are obtained. We find that each DOF can be described by a unique combination of only three Zernike terms. Additionally, a database with the first 15 Zernike coefficients is created by simulating random alignment states and used to train a simple fully-connected neural network. The neural network was able to determine the alignment states of unknown samples with errors below 3%. The combination of Zernike polynomials and neural networks could potentially lead to single-iteration alignment of KB mirrors using wavefront sensing techniques as a diagnostic tool.
Due to its outstanding thermal properties and low x-ray loss diamond had been considered a material for x-ray refractive optics for a long time. Several diamond lens prototypes had been produced by various groups and tested at different light sources. However a commercial grade diamond lens is not yet on the market. Because of the large number of complex fabrication steps involved (packaging, laser ablation, polishing and metrology) combined with stringent accuracy requirements (1 micron standard deviation from the designed paraboloid shape) diamond lenses are not consistent from one to another.
In this paper we will review the recent progress in lens development and share results demonstrating that a beamline-ready diamond refractive lens is now available.
X-ray Compound Refractive Lenses (CRLs) made out of diamond have a number of attractive features for applications at modern light sources, such as relatively large refractive index decrement and yet relatively low absorption for hard Xrays, low thermal expansion coefficient and high mechanical rigidity (allowing to safely use them as first optical elements of beamlines), and relatively low undesirable scattering from their volume. However, diamond CRLs are hard to fabricate and process to a (sub-)micron accuracy of the surface shape, required for aberration-free focusing of hard Xrays. We will report on results of experimental tests of first generation 2D diamond CRLs manufactured by Euclid Techlabs LLC. The tests were performed at the Coherent Hard X-ray beamline of the National Synchrotron Light Source II, and included measurements of intensity profiles of ~13 keV undulator radiation focused by one diamond lens in a low-demagnification geometry. Such geometry is typically used for the X-ray beam transport and can be used for the imaging-based diagnostics of the emitting electron beam. The quality of X-ray focusing with the new diamond CRL was analyzed by comparing the measurement results with partially-coherent wave-optics simulations performed with Synchrotron Radiation Workshop code. The tests of the diamond CRL also included measurements of small-angle X-ray scattering produced by it, and comparison of these data with the scattering data from a beryllium CRL with the same focal length.
The advent of 4th generation high-energy synchrotron facilities (ESRF-EBS and the planned APS-U, PETRA-IV and SPring-8 II) and free-electron lasers (Eu-XFEL and LCLS-II) allied with the recent demonstration of high- quality free-form refractive optics for beam shaping and optical correction have revived interest in compound refractive lenses (CRLs) as optics for beam transport, probe formation in X-ray micro- and nano-analysis as well as for imaging applications. Ideal CRLs have long been made available in the 'Synchrotron Radiation Workshop' (SRW), however, the current context requires more sophisticated modelling of X-ray lenses. In this work, we revisit the already implemented wave-optics model for an ideal X-ray lens in the projection approximation and propose modifications to it as to allow more degrees of freedom to both the front and back surfaces independently, which enables to reproduce misalignments and manufacturing errors commonly found in X-ray lenses. For the cases where simply tilting and transversely offsetting the parabolic sections of a CRL is not enough, we present the possibility of generating the figure errors by using Zernike and Legendre polynomials or directly adding metrology data to the lenses. We present the effects of each new degree of freedom by calculating their impact on point spread function and the beam caustics.
This paper presents the latest developments on filter-wheel based multispectral imaging systems as well as their extension to making 3D images. The system, capable of producing high spatial resolution images on a spectrum spanning from 400nm to 1050nm (in 12 steps of 50nm (configurable) with 50nm or less bandwidth) can be used, without hardware change. To produce 3D image stacks where the height resolution is given by the numerical aperture of the optics used and the reproducibility of the image plane moving motor is also possible. This paper introduces the reader to spectral imaging and to 3D measurement techniques. The main parameters and relevant publications of/about the industrial monocular multispectral 3D-Imager are then presented. Correction of chromatic aberration on filter wheel system, a key idea for 3D image reconstruction, is revised. 3D imaging capabilities of the system as well as proper calibration are introduced. Selected applications and algorithms are presented towards to the end of the paper.
Conference Committee Involvement (1)
Advances in X-Ray/EUV Sources, Optics, and Components XX
3 August 2025 | San Diego, California, United States
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