Dr. Piet De Moor Profile

Dr. Piet De Moor

Group Leader Heterogeneous Microsystems at imec

SPIE Involvement:

Author | Editor

Publications (23)

Proceedings Article | 20 February 2018 Presentation + Paper

Presentation + Paper

A 100 Mfps image sensor for biological applications

T. Goji Etoh, Kazuhiro Shimonomura, Anh Quang Nguyen, Kosei Takehara, Yoshinari Kamakura, Paul Goetschalckx, Luc Haspeslagh, Piet De Moor, Vu Truong Son Dao, Hoang Dung Nguyen, Naoki Hayashi, Yo Mitsui, Hideo Inumaru

Proceedings Volume 10505, 1050506 (2018) https://doi.org/10.1117/12.2288861

KEYWORDS: Image sensors, Sensors, Temporal resolution, Electrons, Charge-coupled devices, Silicon, Picosecond phenomena, Monte Carlo methods, Fluorescence lifetime imaging, Photons

Read Abstract +

Proceedings Article | 17 November 2017 Open Access

Open Access

Paper

A platform for European CMOS image sensors for space applications

K. Minoglou, D. San Segundo Bello, D. Sabuncuoglu Tezcan, L. Haspeslagh, J. Van Olmen, B. Merry, C. Cavaco, F. Mazzamuto, I. Toqué-Trésonne, R. Moirin, M. Brouwer, M. Toccafondi, G. Preti, M. Rosmeulen, P. De Moor

Proceedings Volume 10563, 1056304 (2017) https://doi.org/10.1117/12.2304233

KEYWORDS: Semiconducting wafers, Silicon, Imaging systems, Image processing, Antireflective coatings, Annealing, Astronomical imaging, Analog electronics, Coating, Optical amplifiers

Read Abstract +

Proceedings Article | 25 September 2017 Open Access

Open Access

Paper

High speed TDI embedded CCD in CMOS sensor

P. Boulenc, J. Robbelein, L. Wu, L. Haspeslagh, P. De Moor, J. Borremans, M. Rosmeulen

Proceedings Volume 10562, 105622P (2017) https://doi.org/10.1117/12.2296149

Read Abstract +

Proceedings Article | 25 September 2017 Open Access

Open Access

Paper

EUROCMOSHF: demonstration of a fully European supply chain for space image sensors

P. De Moor, K. De Munck, L. Haspeslagh, S. Guerrieri, J. Van Olmen, G. Meynants, G. Beeckman, K. Vanwichelen, K. Van Esbroeck, Alexandre Ghiglione, Teva Gilbert, Stéphane Demiguel

Proceedings Volume 10562, 105622O (2017) https://doi.org/10.1117/12.2296145

KEYWORDS: Imaging systems, Image processing, Capacitance, Analog electronics, Image sensors, Camera shutters, Diffusion, Astronomical imaging, CMOS sensors, Manufacturing

Read Abstract +

Proceedings Article | 3 October 2011 Paper

Paper

Hybrid backside illuminated CMOS image sensors possessing low crosstalk

Padmakumar Ramachandra Rao, Koen De Munck, Kyriaki Minoglou, Joeri De Vos, Deniz Sabuncuoglu, Piet De Moor

Proceedings Volume 8176, 81761D (2011) https://doi.org/10.1117/12.901234

KEYWORDS: Imaging systems, Quantum efficiency, Semiconducting wafers, Sensors, Silicon, Metals, Aluminum, Modulation transfer functions, Indium, Detector arrays

Read Abstract +

Proceedings Article | 5 May 2011 Paper

Paper

EUV detectors based on AlGaN-on-Si Schottky photodiodes

P. Malinowski, J.-Y. Duboz, P. De Moor, K. Minoglou, J. John, P. Srivastava, F. Semond, E. Frayssinet, A. BenMoussa, B. Giordanengo, C. Van Hoof, R. Mertens

Proceedings Volume 8073, 807302 (2011) https://doi.org/10.1117/12.886682

KEYWORDS: Silicon, Extreme ultraviolet, Sensors, Imaging systems, Photodiodes, Photodetectors, Semiconducting wafers, Ultraviolet radiation, Diodes, Aluminum

Read Abstract +

Proceedings Article | 14 May 2010 Paper

Paper

AlGaN-on-Si backside illuminated photodetectors for the extreme ultraviolet (EUV) range

P. Malinowski, J.-Y. Duboz, J. John, C. Sturdevant, J. Das, J. Derluyn, M. Germain, P. De Moor, K. Minoglou, F. Semond, E. Frayssinet, J.-F. Hochedez, B. Giordanengo, C. Van Hoof, R. Mertens

Proceedings Volume 7726, 772617 (2010) https://doi.org/10.1117/12.853782

KEYWORDS: Extreme ultraviolet, Photodetectors, Sensors, Silicon, Gallium nitride, Etching, Ultraviolet radiation, Imaging systems, Visible radiation, Reactive ion etching

Read Abstract +

Proceedings Article | 23 September 2009 Paper

Paper

Monolithic and hybrid backside illuminated active pixel sensor arrays

K. De Munck, K. Minoglou, R. Padmakumar, D. Tezcan, J. Bogaerts, I. Veltroni, C. Van Hoof, P. De Moor

Proceedings Volume 7474, 74741B (2009) https://doi.org/10.1117/12.834828

KEYWORDS: Imaging systems, Quantum efficiency, Semiconducting wafers, Sensors, Ultraviolet radiation, Silicon, Detector arrays, Modulation transfer functions, Readout integrated circuits, Absorption

Read Abstract +

Proceedings Article | 18 May 2009 Paper

Paper

Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam

Pawel Malinowski, Joachim John, Frank Barkusky, Jean Yves Duboz, Anne Lorenz, Kai Cheng, Joff Derluyn, Marianne Germain, Piet De Moor, Kyriaki Minoglou, Armin Bayer, Klaus Mann, Jean-Francois Hochedez, Boris Giordanengo, Gustaaf Borghs, Robert Mertens

Proceedings Volume 7361, 73610T (2009) https://doi.org/10.1117/12.820691

KEYWORDS: Photodetectors, Gallium nitride, Extreme ultraviolet, Silicon, Photodiodes, Extreme ultraviolet lithography, Sun, Imaging systems, Gold, Sensors

Read Abstract +

Proceedings Article | 22 July 2008 Paper

Paper

Cold performance tests of blocked-impurity-band Si:As detectors developed for DARWIN

Stephan Birkmann, Jutta Stegmaier, Ulrich Grözinger, Oliver Krause, Tim Souverijns, Jan Putzeys, Deniz Sabuncuoglu Tezcan, Koen De Munck, Paolo Fiorini, Kiki Minoglou, Patrick Merken, Chris Van Hoof, Piet De Moor

Proceedings Volume 7021, 70210R (2008) https://doi.org/10.1117/12.789103

KEYWORDS: Sensors, Electronics, Quantum efficiency, Temperature metrology, Signal detection, Black bodies, Bolometers, Bandpass filters, Monochromators, Camera shutters

Read Abstract +

Proceedings Article | 12 September 2007 Paper

Paper

Development of a Si:As blocked impurity band detector for far IR detection

Deniz Tezcan, Jan Putzeys, Koen De Munck, Tim Souverijns, Patrick Merken, Paolo Fiorini, Chris Van Hoof, Thierry Dartois, Claude Israbian, Stephan Birkmann, Jutta Stegmaier, Ulrich Grözinger, Oliver Krause, Piet De Moor

Proceedings Volume 6660, 66600R (2007) https://doi.org/10.1117/12.733779

KEYWORDS: Sensors, Detector arrays, Semiconducting wafers, Infrared sensors, Silicon, Capacitors, Amplifiers, Infrared radiation, Indium, Cryogenics

Read Abstract +

Proceedings Article | 22 January 2005 Paper

Paper

Characterization of (near) hermetic zero-level packages for MEMS

Piet De Moor, Kris Baert, Ingrid De Wolf, Anne Jourdain, Harrie Tilmans, Ann Witvrouw, Chris Van Hoof

Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.596190

KEYWORDS: Microelectromechanical systems, Packaging, Sensors, Semiconducting wafers, Reliability, Resonators, Microbolometers, Liquids, Spectroscopy, Thin films

Read Abstract +

Proceedings Article | 8 September 2004 Paper

Paper

High-density hybrid interconnect technologies

Joachim John, Lars Zimmermann, Piet De Moor, Koen De Munck, Tom Borgers, Chris Van Hoof

Proceedings Volume 5454, (2004) https://doi.org/10.1117/12.546738

KEYWORDS: Sensors, Indium, Semiconducting wafers, Staring arrays, Silicon, Readout integrated circuits, Extreme ultraviolet, Infrared radiation, Ultraviolet radiation, Oxides

Read Abstract +

Proceedings Article | 10 October 2003 Paper

Paper

Small two-dimensional and linear arrays of polycrystalline SiGe microbolometers at IMEC-XenICs

Vladimir Leonov, Ybe Creten, Piet De Moor, Bert Du Bois, Claus Goessens, Bob Grietens, Patrick Merken, Natalia Perova, Gerlinde Ruttens, Chris Van Hoof, Agnes Verbist, Jan Vermeiren

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.487084

KEYWORDS: Bolometers, Sensors, Microbolometers, Infrared radiation, Resistance, Readout integrated circuits, Temperature metrology, Calibration, Black bodies, Thermography

Read Abstract +

Proceedings Article | 25 March 2003 Paper

Paper

Micromachined poly-SiGe bolometer arrays for infrared imaging and spectroscopy

Vladimir Leonov, Natalia Perova, Piet De Moor, Bert Du Bois, Claus Goessens, Bob Grietens, Agnes Verbist, Chris Van Hoof, Jan Vermeiren

Proceedings Volume 4945, (2003) https://doi.org/10.1117/12.468410

KEYWORDS: Bolometers, Sensors, Resistance, Microbolometers, Infrared radiation, Thermography, Infrared imaging, Infrared bolometers, Imaging arrays, Thermal modeling

Read Abstract +

Proceedings Article | 5 August 2002 Paper

Paper

Optimization of design and technology for uncooled poly-SiGe microbolometer arrays

Vladimir Leonov, Natalia Perova, Jan Vermeiren, Bob Grietens, Claus Goessens, Piet De Moor, Chris Van Hoof

Proceedings Volume 4721, (2002) https://doi.org/10.1117/12.478840

KEYWORDS: Bolometers, Semiconducting wafers, Microbolometers, Resistance, Sensors, Silicon, Temperature metrology, Absorption, Infrared bolometers, Computer simulations

Read Abstract +

Proceedings Article | 12 June 2001 Paper

Paper

Process development of fast and sensitive polySiGe microbolometer arrays

Piet De Moor, Spyros Kavadias, Vladimir Leonov, Chris Van Hoof

Proceedings Volume 4288, (2001) https://doi.org/10.1117/12.429397

KEYWORDS: Bolometers, Microbolometers, Germanium, Packaging, Silicon, Sensors, Surface micromachining, Etching, Metals, Infrared bolometers

Read Abstract +

Proceedings Article | 22 February 2001 Paper

Paper

Hybrid and monolithic infrared detector arrays

Chris Van Hoof, Lars Zimmermann, Joachim John, Piet De Moor, Spyros Kavadias, Martin Gastal, Stefan Nemeth, Gustaaf Borghs, Patrick Merken

Proceedings Volume 4355, (2001) https://doi.org/10.1117/12.417784

KEYWORDS: Sensors, Bolometers, Etching, Diodes, Detector arrays, Infrared detectors, Indium, Gallium arsenide, Semiconducting wafers, Infrared sensors

Read Abstract +

Proceedings Article | 9 February 2001 Paper

Paper

Hybrid long-wavelength IR sensor based on a linear array of poly Si-Ge uncooled microbolometers with a CMOS readout

Spyros Kavadias, Piet De Moor, Martin Gastal, Niki Hendrikx, Filip Wirix, Chris Van Hoof

Proceedings Volume 4169, (2001) https://doi.org/10.1117/12.417122

KEYWORDS: Bolometers, Sensors, Amplifiers, Infrared sensors, Resistance, Microbolometers, Ceramics, Optical amplifiers, Resistors, CMOS technology

Read Abstract +

Proceedings Article | 25 August 2000 Paper

Paper

Comparison between wet HF etching and vapor HF etching for sacrificial oxide removal

Ann Witvrouw, Bert Du Bois, Piet De Moor, Agnes Verbist, Chris Van Hoof, Hugo Bender, Christiaan Baert

Proceedings Volume 4174, (2000) https://doi.org/10.1117/12.396423

KEYWORDS: HF etching, Etching, Oxides, Vapor etching, Metals, Semiconducting wafers

Read Abstract +

Proceedings Article | 17 July 2000 Paper

Paper

Linear arrays of fast uncooled poly-SiGe microbolometers for IR detection

Piet De Moor, Joachim John, Sherif Sedky, Chris Van Hoof

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391754

KEYWORDS: Bolometers, Etching, Semiconducting wafers, Microbolometers, Silicon, Sensors, Infrared detection, Germanium, Packaging, Beam shaping

Read Abstract +

Proceedings Article | 31 August 1999 Paper

Paper

Linear arrays of uncoolded poly SiGe microbolometers for IR detection

Piet De Moor, Sherif Sedky, Deniz Sabuncuoglu, Chris Van Hoof

Proceedings Volume 3876, (1999) https://doi.org/10.1117/12.360502

KEYWORDS: Microbolometers, Sensors, Infrared detection, Thermography, Germanium, HF etching, Etching, Bolometers, Silicon, Infrared sensors

Read Abstract +

Proceedings Article | 30 August 1999 Paper

Paper

Fabrication and reliability testing of Ti/TiN heaters

Piet De Moor, Ann Witvrouw, Veerle Simons, Ingrid De Wolf

Proceedings Volume 3874, (1999) https://doi.org/10.1117/12.361232

KEYWORDS: Resistance, Tin, Semiconducting wafers, Reliability, Temperature metrology, Microscopy, Resistors, Microelectromechanical systems, Sensors, Silicon

Read Abstract +

Showing 5 of 23 publications

Proceedings Volume Editor (2)

SPIE Conference Volume | 22 May 2014

Optical Sensing and Detection III

SPIE Conference Volume | 17 May 2012

Optical Sensing and Detection II

Conference Committee Involvement (2)

Optical Sensing and Detection

14 April 2014 | Brussels, Belgium

Optical Sensing and Detection

16 April 2012 | Brussels, Belgium

SIGN IN TO:

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Advertisement

Advertisement