In some specific applications the electronic speckle pattern
interferometry (ESPI) is superior to other optical surface
metrology methods. The two-wavelength ESPI for surface contouring
can achieve both high accuracy of height resolution in the micron
range and short measurement times far below a second. A further
advantage of this method is that compared to e.g. triangulation,
illumination axis and observation axis can be identical. A problem
of interferometric methods in general are phase ambiguities
originating from discontinuous measurement object surfaces. A
common idea to decrease the range of ambiguity is the fusion of
several interferograms recorded at different wavelengths. This
paper presents a concept for a loss free sequential superposition
of several spatially separated laser beams as well as algorithms
for the determination of measured surface discontinuities. Also a
solution of a stability control for fast wavelength tuning of
laser diodes is presented.
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