Mr. Peter Pira Profile

Peter Pira

at Charles Univ

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Author

Publications (4)

Proceedings Article | 12 May 2015 Paper

Material properties of lithium fluoride for predicting XUV laser ablation rate and threshold fluence

Tomáš Blejchař, Václav Nevrlý, Michal Vašinek, Michal Dostál, Lukáš Pečínka, Jakub Dlabka, Martin Stachoň, Libor Juha, Petr Bitala, Zdeněk Zelinger, Peter Pira, Jan Wild

Proceedings Volume 9511, 95110K (2015) https://doi.org/10.1117/12.2178437

KEYWORDS: Laser ablation, Laser induced fluorescence, Extreme ultraviolet, Lithium, Data modeling, Laser damage threshold, Signal attenuation, Pulsed laser operation, Statistical analysis, Estimation theory

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Proceedings Article | 3 May 2013 Paper

Global sensitivity analysis of the XUV-ABLATOR code

Václav Nevrlý, Jaroslav Janků, Jakub Dlabka, Michal Vašinek, Libor Juha, Luděk Vyšín, Tomáš Burian, Ján Lančok, Jan Skřínský, Zdeněk Zelinger, Petr Pira, Jan Wild

Proceedings Volume 8777, 87770C (2013) https://doi.org/10.1117/12.2017542

KEYWORDS: Silica, Laser ablation, Extreme ultraviolet, Silicon, Polymethylmethacrylate, Pulsed laser operation, Data modeling, Systems modeling, Computer simulations, Laser damage threshold

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Proceedings Article | 23 May 2011 Paper

Ablation of ionic crystals induced by capillary-discharge XUV laser

Peter Pira, Tomáš Burian, Ludék Vyšín, Jaromír Chalupský, Ján Lančok, Jan Wild, Michal Střižík, Zdeněk Zelinger, Jorge Rocca, Libor Juha

Proceedings Volume 8077, 807719 (2011) https://doi.org/10.1117/12.890406

KEYWORDS: Extreme ultraviolet, Laser induced fluorescence, Laser ablation, Crystals, Laser crystals, Pulsed laser deposition, Mirrors, Capillaries, Digital image correlation, Dielectrics

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Proceedings Article | 18 May 2009 Paper

Characterization of the focused beam of desktop 10-Hz capillary-discharge 46.9-nm laser

Ludek Vyšin, Tomás Burian, Jaromír Chalupský, Michael Grisham, Vera Hájková, Scott Heinbuch, Krzysztof Jakubczak, Dale Martz, Tomás Mocek, Peter Pira, Jirí Polan, Jorge Rocca, Bedrich Rus, Jaroslav Sobota, Libor Juha

Proceedings Volume 7361, 73610O (2009) https://doi.org/10.1117/12.822759

KEYWORDS: Capillaries, Extreme ultraviolet, Plasma, Polymethylmethacrylate, Mirrors, Argon, Microscopes, Ions, Physics, Spherical lenses

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