Prof. Paul M. Koenraad
at Technische Univ Eindhoven
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 1 March 2011 Paper
J. Ulloa, M. del Moral, M. Montes, M. Bozkurt, P. Koenraad, A. Guzmán, A. Hierro
Proceedings Volume 7947, 79470T (2011) https://doi.org/10.1117/12.875014
KEYWORDS: Antimony, Quantum dots, Chemical species, Gallium arsenide, Indium arsenide, Temperature metrology, Statistical analysis, Atomic force microscopy, Scanning tunneling microscopy, Optical properties

Proceedings Article | 23 January 2010 Paper
N. Bertru, C. Paranthoen, O. Dehaese, H. Folliot, A. Le Corre, R. Piron, F. Grillot, W. Lu, J. Even, G. Elias, C. Levallois, S. Loualiche, M. Bozkurt, J. Ulloa, P. Koenraad, A. Ponchet
Proceedings Volume 7608, 76081B (2010) https://doi.org/10.1117/12.848398
KEYWORDS: Indium arsenide, Nanostructures, Antimony, Laser damage threshold, Arsenic, Gallium arsenide, Quantum dots, Atomic force microscopy, Quantum wells, Quantum dot lasers

Proceedings Article | 28 May 2009 Paper
V. Fomin, V. Gladilin, J. Devreese, J. Blokland, P. C. Christianen, J. Maan, A. Taboada, D. Granados, J. García, N. A. J. Kleemans, H. C. van Genuchten, M. Bozkurt, P. Koenraad
Proceedings Volume 7364, 736402 (2009) https://doi.org/10.1117/12.822607
KEYWORDS: Excitons, Magnetism, Semiconductors, Luminescence, Anisotropy, Shape analysis, Magnetic semiconductors, Microscopy, Temperature metrology, Oscillators

Proceedings Article | 25 January 2007 Paper
Nerija Žurauskienė, Griet Janssen, Etienne Goovaerts, Marek Godlewski, Vitalii Yu. Ivanov, Paul Koenraad
Proceedings Volume 6596, 659609 (2007) https://doi.org/10.1117/12.726363
KEYWORDS: Microwave radiation, Indium arsenide, Magnetism, V band, Gallium arsenide, Quantum dots, Excitons, Luminescence, Signal detection, Chromium

Proceedings Article | 1 March 1991 Paper
O. Albrektsen, Paul Koenraad, Huub Salemink
Proceedings Volume 1361, (1991) https://doi.org/10.1117/12.24365
KEYWORDS: Spectroscopy, Molecular beam epitaxy, Interfaces, Gallium arsenide, Scanning tunneling microscopy, Semiconductors, Image resolution, Heterojunctions, Optoelectronic devices, Spatial resolution

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