CONFERENCE PROCEEDINGS
Advanced Search
Prof. Paul H. Fuoss
at Argonne National Lab
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 23 May 2017 Presentation + Paper
Characterization of the LCLS “nanosecond two-bunch” mode for x-ray speckle visibility spectroscopy experiments
Yanwen Sun, Diling Zhu, Sanghoon Song, Franz-Josef Decker, Mark Sutton, Karl Ludwig, Wojciech Roseker, Gerhard Grübel, Stephan Hruszkewycz, G. Brian Stephenson, Paul Fuoss, Aymeric Robert
Proceedings Volume 10237, 102370N (2017) https://doi.org/10.1117/12.2265454
KEYWORDS: X-rays, Scattering, Dynamic light scattering, Speckle, Free electron lasers, Spectroscopy, Light sources, Nondestructive evaluation, Photodetectors, Visibility, X-ray characterization
Proceedings Article | 17 October 2012 Paper
Hard x-ray delay line for x-ray photon correlation spectroscopy and jitter-free pump-probe experiments at LCLS
Wojciech Roseker, Sooheyong Lee, Michael Walther, Horst Schulte-Schrepping, Hermann Franz, Amber Gray, Marcin Sikorski, Paul Fuoss, G. Brian Stephenson, Aymeric Robert, Gerhard Grübel
Proceedings Volume 8504, 85040I (2012) https://doi.org/10.1117/12.929759
KEYWORDS: X-rays, Liquid crystal lasers, Crystals, Speckle pattern, Free electron lasers, Hard x-rays, Sensors, Laser crystals, Dynamic light scattering, Laser scattering
Proceedings Article | 15 September 2007 Paper
Re-Ir coating effect of molding core (WC) surface for aspheric glass lens
Sang-Suk Kim, Hyun-Uk Kim, Hye-Jeong Kim, Jeong-Ho Kim
Proceedings Volume 6717, 671708 (2007) https://doi.org/10.1117/12.754329
KEYWORDS: Aspheric lenses, Glasses, Coating, Precision glass molding, Glass molding, Tungsten, Surface roughness, 3D metrology, Cameras, Lens grinding
Proceedings Article | 2 September 1992 Paper
In-situ x-ray studies of OMVPE growth
Paul Fuoss, Frank Lamelas, P. Imperatori, David Kisker, G. Brian Stephenson, Sean Brennan
Proceedings Volume 1676, (1992) https://doi.org/10.1117/12.137660
KEYWORDS: X-rays, Scattering, Gallium arsenide, Absorption, Laser scattering, X-ray fluorescence spectroscopy, Luminescence, Chemical reactions, Arsenic, Synchrotron radiation
Proceedings Article | 1 October 1990 Paper
Application of x-ray scattering to the in-situ study of organometallic vapor phase epitaxy
David Kisker, Paul Fuoss, Goullioud Renaud, K. Tokuda, Sean Brennan, J. Kahn
Proceedings Volume 1285, (1990) https://doi.org/10.1117/12.20803
KEYWORDS: Gallium arsenide, X-rays, Scattering, Oxides, Hydrogen, Vapor phase epitaxy, Semiconductors, Data modeling, Natural surfaces, Epitaxy
Conference Committee Involvement (1)
Advances in Computational Methods for X-Ray Optics V
25 August 2020 | Online Only, California, United States
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top