Pascal Grosmann
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 May 2019 Paper
Proceedings Volume 10991, 1099109 (2019) https://doi.org/10.1117/12.2518641
KEYWORDS: 3D metrology, 3D modeling, Reconstruction algorithms, 3D image processing, Scanners, 3D acquisition

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