When conventional physical pinholes are used, the alignment of pinholes is always a problem. An iterative Wiener
deconvolution filter is used to reject out-of-focus light, a sub-pixel centre location method is used to locate the centre of
the pinhole, and the dimensions of the pinhole are optimized using the confocal microscopic theory. A filter with digital
pinhole is thus developed and compared with filter with conventional physical pinhole through comparative tests.
Experimental results indicate that the alignment of pinholes can be made easy, a filter with digital pinhole can be used to
take place of a filter with conventional physical pinhole, and it can also reduce the pixel crosstalk resulting from multipoint
illumination.
We demonstrate a simple approach to significantly reduce the electrical resistivity of thermo-responsive shape-memory
polymers (SMPs), so that they can be easily triggered for shape recovery by Joule heating at a low electrical voltage.
After adding a small amount of Ni micro particles into a polyurethane SMP filled with carbon black (CB), the electrical
resistivity is slightly reduced. However, if these Ni particles are aligned into chains (by applying a low magnetic field on
SMP/CB/Ni solution and then drying to fix the conductive chains), the drop of electrical resistivity is significant. This
kind of SMP composites is suitable for cyclic operation as only micro/nano particles are used. A sample (40×15×1mm)
with 10vol% of CB and 0.5vol% of chained Ni can be heated to 80°C for shape recovery at 30 V (1.2 W) of power. This
approach is generic and applicable for producing other conductive polymers.
A number of finite image distance achromatic spherical microscope objectives with larger numerical
aperture are collected. And the lens system structures are analyzed statistically based on optical design
experience. Then a quantitative formula of the relationship between system structure and deflection angle
on finite image distance achromatic spherical microscope objective, whose deflection angle is up to 0.3, is
proposed. A optical systems for microstructure inspection is obtained on the basis of the fruit. The high
resolution system with simple structure is achieved. Accordingly the efficiency of initial structure selection
study on achromatic microscope objective (deflection angle up to 0.3) is validated.
A microstructure inspection endoscope, based on directly imaging, is proposed. It is designed for detecting defects on the surface of optical fiber end. It is matched with FC or SC female fiber connector. The inspection head of the endoscope can be put into a 2.5-millimeter-diameter micro-pore. Its numerical aperture is not restricted by tiny dimension of object lenses. System resolution is increased to 600 line-pairs per millimeter. The endoscope consists of object lenses, scanner slab and kohler illumination system. The design provides possibility of various utilities such as aiming at a smaller subject by micro optical scanner and modeling the surface by tri-dimensional vision. And the optical system includes low-magnification lenses and high-magnification zoom lenses. Rough observation at low-magnification and particularly inspection at high-magnification are provided. The instrument has the advantages of high identification, compact configuration and flexible manipulation.
In this paper, an apparatus has been designed to inspect the end surface of fiber optic connectors. A white-light high-brightness light emitting diode has been adopted to offer enough light power. Zoom lenses comprise field lens and achromatic lens with a large range of magnification from 1.25 to 60. They can be used to inspect not only the whole ferrule but also the details of the core. The illumination system has two modes: perpendicular and oblique. In oblique illumination, the relation on the maximum length of shadow
along the incident direction and the angle of oblique illumination is disclosed and the curvature of shadow is drawn. Fiber undercut and protrusion can be judged whether they are satisfied the tolerance with the curvature.
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