Masahiko Okumura
at Nikon Corp
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 March 2010 Paper
Yasushi Mizuno, Tomoyuki Matsuyama, Soichi Owa, Osamu Tanitsu, Naonori Kita, Masahiko Okumura
Proceedings Volume 7640, 76401I (2010) https://doi.org/10.1117/12.846476
KEYWORDS: Double patterning technology, Immersion lithography, Zernike polynomials, Optical lithography, Photomasks, Lithographic illumination, Modulation, Resolution enhancement technologies, Source mask optimization, Fiber optic illuminators

Proceedings Article | 7 March 2008 Paper
Proceedings Volume 6924, 69241N (2008) https://doi.org/10.1117/12.771823
KEYWORDS: Semiconducting wafers, Calibration, Immersion lithography, Sensors, Scanners, Critical dimension metrology, Lens design, Manufacturing, Imaging systems, Control systems

Proceedings Article | 21 March 2006 Paper
Proceedings Volume 6154, 61541U (2006) https://doi.org/10.1117/12.656349
KEYWORDS: Semiconducting wafers, Calibration, Polarization, Imaging systems, Water, Lithography, Scanners, Resonance energy transfer, Projection systems, Wavefronts

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