Dr. Marc M. Ellenrieder Profile

Dr. Marc M. Ellenrieder

at Airbus Defence and Space

SPIE Involvement:

Author

Proceedings Article | 23 July 2008 Paper

The optical components of the NIRSpec wheel mechanisms

Marc Ellenrieder, K. Weidlich, B. Nelles, B. Ploss, S. Bruynooghe, J. Köhler, M. Te Plate

Proceedings Volume 7018, 701822 (2008) https://doi.org/10.1117/12.789727

KEYWORDS: Optical components, Optical filters, Mirrors, Optical design, Prisms, Coating, Manufacturing, Optoelectronics, Optics manufacturing, Cryogenics

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Proceedings Article | 23 July 2008 Paper

High-precision cryogenic wheel mechanisms for the JWST NIRSpec instrument

Kai Weidlich, Manfred Fischer, Marc Ellenrieder, Torsten Gross, Jean-Christophe Salvignol, Reiner Barho, Christian Neugebauer, Günter Königsreiter, Michael Trunz, Friedrich Müller, Oliver Krause

Proceedings Volume 7018, 701821 (2008) https://doi.org/10.1117/12.789663

KEYWORDS: Optical components, Optical filters, Prisms, Aerospace engineering, Sensors, Magnetism, Optical alignment, Position sensors, James Webb Space Telescope, Cryogenics

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Proceedings Article | 6 July 2006 Paper

The grating and filter wheels for the JWST NIRSpec instrument

K. Weidlich, M. Sedlacek, M. Fischer, M. Trunz, M. Ellenrieder, D. Lemke, O. Krause, R. Hofferbert, U. Grözinger, G. Königsreiter, C. Neugebauer

Proceedings Volume 6273, 627323 (2006) https://doi.org/10.1117/12.670692

KEYWORDS: Optical components, Optical filters, Mirrors, Optical design, Prisms, Position sensors, Structural design, James Webb Space Telescope, Cryogenics, Diffraction gratings

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Proceedings Article | 13 June 2005 Paper

Reflectivity function based illumination and sensor planning for industrial inspection

Marc Ellenrieder, Christian Wohler, Pablo d'Angelo

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612547

KEYWORDS: Cameras, Sensors, Image segmentation, Lamps, Inspection, Reflectivity, Bidirectional reflectance transmission function, Aluminum, Camera shutters, Visibility

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Proceedings Article | 11 March 2005 Paper

Model-based automatic calculation and evaluation of camera positions for industrial machine vision

Marc Ellenrieder, Hitoshi Komoto

Proceedings Volume 5674, (2005) https://doi.org/10.1117/12.585427

KEYWORDS: Visual process modeling, Optical spheres, Cameras, Sensors, Inspection, Machine vision, Computer aided design, Content addressable memory, Model-based design, Visibility

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Proceedings Article | 17 January 2005 Paper

Pose estimation of tube-shaped flexible objects from geometrically rectified shadow images

Marc Ellenrieder

Proceedings Volume 5675, (2005) https://doi.org/10.1117/12.585044

KEYWORDS: Light sources, Cameras, Calibration, Image processing, Lamps, Inspection, Distortion, Machine vision, Model-based design, 3D image processing

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Proceedings Article | 21 May 2004 Paper

Shape reconstruction of flexible objects from monocular images for industrial applications

Marc Ellenrieder

Proceedings Volume 5299, (2004) https://doi.org/10.1117/12.525080

KEYWORDS: Data modeling, Cameras, Inspection, Distortion, 3D modeling, Optical inspection, Stereoscopic cameras, Reconstruction algorithms, Optimization (mathematics), 3D image processing

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Proceedings Article | 28 May 2003 Paper

A general approach for multifeature multisensor classification and localization of 3D objects in 2D image sequences

Thorsten Koelzow, Marc Ellenrieder

Proceedings Volume 5014, (2003) https://doi.org/10.1117/12.477727

KEYWORDS: Data modeling, Image processing, 3D modeling, Optical inspection, Image classification, Receptors, Model-based design, Process modeling, Solid modeling, 3D image processing

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Showing 5 of 8 publications

Conference Committee Involvement (5)

Image Processing: Machine Vision Applications III

20 January 2010 | San Jose, California, United States

Image Processing: Machine Vision Applications II

22 January 2009 | San Jose, California, United States

Image Processing: Machine Vision Applications

29 January 2008 | San Jose, California, United States

Machine Vision Applications in Industrial Inspection XV

29 January 2007 | San Jose, CA, United States

Machine Vision Applications in Industrial Inspection XIV

16 January 2006 | San Jose, California, United States

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