Dr. Linus Jang
Technical Chief of Staff at ASML Hillsboro
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 27 March 2014 Paper
Linus Jang, Young Joon Moon, Ryoung-Han Kim, Christopher Bencher, Huixiong Dai, Peng Xie, Daniel Diehl, Yong Cao, Wilson Zeng, Christopher Ngai
Proceedings Volume 9051, 90510Y (2014) https://doi.org/10.1117/12.2046107
KEYWORDS: Photoresist materials, Optical lithography, Etching, Lithography, Semiconducting wafers, Silicon, System on a chip, Double patterning technology, Manufacturing, Reflectivity

Proceedings Article | 23 March 2012 Paper
Proceedings Volume 8322, 832229 (2012) https://doi.org/10.1117/12.915868
KEYWORDS: Printing, Extreme ultraviolet, Optical lithography, Lithography, Extreme ultraviolet lithography, Photomasks, Lithographic illumination, Double patterning technology, Line edge roughness, Metals

Proceedings Article | 15 March 2012 Paper
Proceedings Volume 8325, 83250D (2012) https://doi.org/10.1117/12.916952
KEYWORDS: Etching, Semiconducting wafers, Double patterning technology, Oxides, Photoresist processing, Critical dimension metrology, Chemical reactions, Fermium, Frequency modulation, Scanning electron microscopy

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